TOPOMETRIX CORP.

Organization

SANTA BARBARA, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Resonance contact scanning force microscope
- Patent number 5,681,987
- Issue date Oct 28, 1997
- TopoMetrix Corporation
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning apparatus linearization and calibration system
- Patent number 5,641,897
- Issue date Jun 24, 1997
- Topometrix
- Marc Robert Schuman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Resonance contact scanning force microscope
- Patent number 5,625,142
- Issue date Apr 29, 1997
- TopoMetrix Corporation
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron...
- Patent number 5,510,615
- Issue date Apr 23, 1996
- TopoMetrix Corporation
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Synchronous sampling scanning force microscope
- Patent number 5,507,179
- Issue date Apr 16, 1996
- Topometrix
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Resonance contact scanning force microscope
- Patent number 5,481,908
- Issue date Jan 9, 1996
- TopoMetrix Corporation
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning apparatus linearization and calibration system
- Patent number 5,469,734
- Issue date Nov 28, 1995
- Topometrix
- Marc R. Schuman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron
- Patent number 5,455,420
- Issue date Oct 3, 1995
- Topometrix
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal sensing scanning probe microscope and method for measuremen...
- Patent number 5,441,343
- Issue date Aug 15, 1995
- TopoMetrix Corporation
- Russell J. Pylkki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Synchronous sampling scanning force microscope
- Patent number 5,406,832
- Issue date Apr 18, 1995
- TopoMetrix Corporation
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope
- Patent number 5,319,960
- Issue date Jun 14, 1994
- Topometrix
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with integrated optics and cantilever mount
- Patent number 5,291,775
- Issue date Mar 8, 1994
- Topometrix
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High resolution electromechanical translation device
- Patent number 5,260,622
- Issue date Nov 9, 1993
- TopoMetrix Corporation
- Paul E. West
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

Information Trademark
74386319 - NANOVISION
- Serial number 74386319
- Registration number 1933575
- Filing date Apr 30, 1993
- American Telephone and Telegraph Company
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74222008 - SUPERTIP
- Serial number 74222008
- Filing date Nov 13, 1991
- TopoMetrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74197926 - TOPOMETRIX
- Serial number 74197926
- Registration number 1713244
- Filing date Aug 26, 1991
- TopoMetrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

TOPOMETRIX CORP.

Organization

Patents Grantslast 30 patents

Resonance contact scanning force microscope

Scanning apparatus linearization and calibration system

Resonance contact scanning force microscope

Scanning probe microscope apparatus for use in a scanning electron...

Synchronous sampling scanning force microscope

Resonance contact scanning force microscope

Scanning apparatus linearization and calibration system

Scanning probe microscope apparatus for use in a scanning electron

Thermal sensing scanning probe microscope and method for measuremen...

Synchronous sampling scanning force microscope

Scanning force microscope

Scanning force microscope with integrated optics and cantilever mount

High resolution electromechanical translation device

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

74386319 - NANOVISION

74222008 - SUPERTIP

74197926 - TOPOMETRIX