TSE CO., LTD

Organization

Cheonan-si, Chungcheongnam-do, KR

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Probe pin having gripping structure
- Patent number 12,000,863
- Issue date Jun 4, 2024
- TSE CO., LTD.
- Seung Bae An
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,994,554
- Issue date May 28, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,940,484
- Issue date Mar 26, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electroconductive particles and signal-transmitting connector havin...
- Patent number 11,763,959
- Issue date Sep 19, 2023
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,609,244
- Issue date Mar 21, 2023
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and test apparatus having the same
- Patent number 11,573,248
- Issue date Feb 7, 2023
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and test apparatus having the same
- Patent number 11,506,705
- Issue date Nov 22, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Electro-conductive part protecting member for signal transmission c...
- Patent number 11,233,352
- Issue date Jan 25, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket and test apparatus having the same, manufacturing metho...
- Patent number 11,199,577
- Issue date Dec 14, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and test apparatus having the same, manufacturing metho...
- Patent number 11,131,707
- Issue date Sep 28, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
History management pad of semiconductor test socket, manufacturing...
- Patent number 10,718,809
- Issue date Jul 21, 2020
- TSE CO., LTD
- Bo Hyun Kim
- G01 - MEASURING TESTING

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
- Publication number 20240151769
- Publication date May 9, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
RUBBER SOCKET WITH BUILT-IN COMPONENT
- Publication number 20240125845
- Publication date Apr 18, 2024
- TSE CO., LTD
- Seon A. KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SOCKET
- Publication number 20240094251
- Publication date Mar 21, 2024
- TSE CO., LTD
- Chang Su OH
- G01 - MEASURING TESTING
Information Patent Application
DATA SIGNAL TRANSMISSION CONNECTOR
- Publication number 20240079835
- Publication date Mar 7, 2024
- TSE CO., LTD
- Dea Hyun ROH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE
- Publication number 20230384368
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE
- Publication number 20230384364
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A PROBE TIP AND A PROBE TIP MANUFACTURED BY...
- Publication number 20230366912
- Publication date Nov 16, 2023
- TSE CO., LTD.
- Young Min LEE
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE
- Publication number 20230266361
- Publication date Aug 24, 2023
- TSE CO., LTD.
- Seung Bae AN
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE PIN AND PROBE CARD HAVING SAME
- Publication number 20230258691
- Publication date Aug 17, 2023
- TSE CO., LTD.
- Seok Ho SON
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR TESTING A MOBILE AP
- Publication number 20230236941
- Publication date Jul 27, 2023
- TSE CO., LTD.
- Min Cheol KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING MULTI-LAYER CIRCUIT BOARD INCLUDING EXTREME...
- Publication number 20230147650
- Publication date May 11, 2023
- TSE CO., LTD.
- Byeong Yong LEE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20230069125
- Publication date Mar 2, 2023
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20230065997
- Publication date Mar 2, 2023
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Application
MULTI-LAYER PRINTED CIRCUIT BOARD MADE OF DIFFERENT MATERIALS AND M...
- Publication number 20220386478
- Publication date Dec 1, 2022
- TSE CO., LTD.
- Eun Ha PARK
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
BATCH JOINING TYPE MULTI-LAYER PRINTED CIRCUIT BOARD AND MANUFACTUR...
- Publication number 20220386479
- Publication date Dec 1, 2022
- TSE CO., LTD.
- Doo Hwan PARK
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME
- Publication number 20220099730
- Publication date Mar 31, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME
- Publication number 20220057433
- Publication date Feb 24, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCONDUCTIVE PARTICLES AND SIGNAL-TRANSMITTING CONNECTOR HAVIN...
- Publication number 20220005626
- Publication date Jan 6, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTOR PART PROTECTION MEMBER FOR SIGNAL TRANSMISSION CONNECTOR...
- Publication number 20210313730
- Publication date Oct 7, 2021
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20210302468
- Publication date Sep 30, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...
- Publication number 20210302494
- Publication date Sep 30, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...
- Publication number 20210293880
- Publication date Sep 23, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
HISTORY MANAGEMENT PAD OF SEMICONDUCTOR TEST SOCKET, MANUFACTURING...
- Publication number 20200233029
- Publication date Jul 23, 2020
- TSE CO.,LTD
- Bo Hyun KIM
- G01 - MEASURING TESTING

TSE CO., LTD

Organization

Patents Grantslast 30 patents

Probe pin having gripping structure

Test apparatus for semiconductor package

Test apparatus for semiconductor package

Electroconductive particles and signal-transmitting connector havin...

Test apparatus for semiconductor package

Test socket and test apparatus having the same

Test socket and test apparatus having the same

Electro-conductive part protecting member for signal transmission c...

Test socket and test apparatus having the same, manufacturing metho...

Test socket and test apparatus having the same, manufacturing metho...

History management pad of semiconductor test socket, manufacturing...

Patents Applicationslast 30 patents

TEST APPARATUS FOR IMAGE SENSOR PACKAGE

RUBBER SOCKET WITH BUILT-IN COMPONENT

TEST SOCKET

DATA SIGNAL TRANSMISSION CONNECTOR

TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE

APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE

METHOD OF MANUFACTURING A PROBE TIP AND A PROBE TIP MANUFACTURED BY...

PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE

VERTICAL PROBE PIN AND PROBE CARD HAVING SAME

TEST APPARATUS FOR TESTING A MOBILE AP

METHOD OF MANUFACTURING MULTI-LAYER CIRCUIT BOARD INCLUDING EXTREME...

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

MULTI-LAYER PRINTED CIRCUIT BOARD MADE OF DIFFERENT MATERIALS AND M...

BATCH JOINING TYPE MULTI-LAYER PRINTED CIRCUIT BOARD AND MANUFACTUR...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME

TEST SOCKET AND TEST APPARATUS HAVING THE SAME

ELECTROCONDUCTIVE PARTICLES AND SIGNAL-TRANSMITTING CONNECTOR HAVIN...

CONDUCTOR PART PROTECTION MEMBER FOR SIGNAL TRANSMISSION CONNECTOR...

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...

HISTORY MANAGEMENT PAD OF SEMICONDUCTOR TEST SOCKET, MANUFACTURING...