Ultrapointe Corporation

Organization

San Jose, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 6,288,782
- Issue date Sep 11, 2001
- Ultrapointe Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspecting the surface of a wafer
- Patent number 6,167,148
- Issue date Dec 26, 2000
- Ultrapointe Corporation
- Louis D. Calitz
- G01 - MEASURING TESTING
Information Patent Grant
Ring dilation and erosion techniques for digital image processing
- Patent number 6,148,114
- Issue date Nov 14, 2000
- Ultrapointe Corporation
- Ke Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser imaging system for inspection and analysis of sub-micron part...
- Patent number 5,963,314
- Issue date Oct 5, 1999
- Ultrapointe Corporation
- Bruce W. Worster
- G02 - OPTICS
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 5,923,430
- Issue date Jul 13, 1999
- Ultrapointe Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 5,808,735
- Issue date Sep 15, 1998
- Ultrapointe Corporation
- Ken K. Lee
- G02 - OPTICS
Information Patent Grant
Method of establishing thresholds for image comparison
- Patent number 5,798,830
- Issue date Aug 25, 1998
- Ultrapointe Corporation
- Lakshman Srinivasan
- G02 - OPTICS
Information Patent Grant
Method and apparatus for automatically focusing a microscope
- Patent number 5,783,814
- Issue date Jul 21, 1998
- Ultrapointe Corporation
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Grant
Aperture optimization method providing improved defect detection an...
- Patent number 5,761,336
- Issue date Jun 2, 1998
- Ultrapointe Corporation
- James J. Xu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for automatic focusing of a confocal laser mic...
- Patent number 5,672,861
- Issue date Sep 30, 1997
- Ultrapointe Corporation
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Grant
Automated surface acquisition for a confocal microscope
- Patent number 5,594,235
- Issue date Jan 14, 1997
- Ultrapointe Corporation
- Ken K. Lee
- G02 - OPTICS
Information Patent Grant
Method and structure for generating a surface image of a three dime...
- Patent number 5,557,113
- Issue date Sep 17, 1996
- Ultrapointe Corp.
- Abigail A. Moorhouse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface extraction from a three-dimensional data set
- Patent number H1530
- Issue date May 7, 1996
- Ultrapointe Corporation
- Ken K. Lee
- 395 -
Information Patent Grant
Beam steering apparatus
- Patent number 5,504,630
- Issue date Apr 2, 1996
- Ultrapointe Corporation
- Hans J. Hansen
- G02 - OPTICS
Information Patent Grant
Laser imaging system for inspection and analysis of sub-micron part...
- Patent number 5,479,252
- Issue date Dec 26, 1995
- Ultrapointe Corporation
- Bruce W. Worster
- G02 - OPTICS

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Trademarklast 30 trademarks

Information Trademark
75109135 - IDENTIFIER
- Serial number 75109135
- Registration number 2107955
- Filing date May 24, 1996
- Ultrapointe Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Ultrapointe Corporation

Organization

Patents Grantslast 30 patents

Method for characterizing defects on semiconductor wafers

Method and system for inspecting the surface of a wafer

Ring dilation and erosion techniques for digital image processing

Laser imaging system for inspection and analysis of sub-micron part...

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers

Method of establishing thresholds for image comparison

Method and apparatus for automatically focusing a microscope

Aperture optimization method providing improved defect detection an...

Method and apparatus for automatic focusing of a confocal laser mic...

Automated surface acquisition for a confocal microscope

Method and structure for generating a surface image of a three dime...

Surface extraction from a three-dimensional data set

Beam steering apparatus

Laser imaging system for inspection and analysis of sub-micron part...

Trademarklast 30 trademarks

75109135 - IDENTIFIER