ULVAC-PHI, Inc.

Organization

Kanagawa-ken, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems including pulsed dual-beam charge neutralization
- Patent number 11,915,901
- Issue date Feb 27, 2024
- ULVAC-PHI, INCORPORATED
- Scott R. Bryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas cluster ion beam apparatus and analyzing apparatus
- Patent number 11,145,484
- Issue date Oct 12, 2021
- ULVAC-PHI, Inc.
- Mauo Sogou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source, ion gun, and analysis instrument
- Patent number 9,372,161
- Issue date Jun 21, 2016
- ULVAC-PHI, INC.
- Daisuke Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to provide parallel acquisition of mass spectr...
- Patent number 9,159,539
- Issue date Oct 13, 2015
- ULVAC-PHI, INCORPORATED
- Paul E. Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray irradiation device and analysis device
- Patent number 9,080,947
- Issue date Jul 14, 2015
- National Institute for Materials Science
- Hiromichi Yamazui
- G01 - MEASURING TESTING
Information Patent Grant
Sample introduction and transfer system and method
- Patent number 7,581,916
- Issue date Sep 1, 2009
- ULVAC-PHI, Inc.
- Mark C. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoemission electron microscopy and measuring method using the mi...
- Patent number 7,034,295
- Issue date Apr 25, 2006
- ULVAC-PHI, Inc.
- Takanori Koshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of treating metal analysis sample and device thereof
- Patent number 6,726,739
- Issue date Apr 27, 2004
- JFE Steel Corporation
- Kenji Abiko
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS INCLUDING PULSED DUAL-BEAM CHARGE NEUTRALIZATION
- Publication number 20230245848
- Publication date Aug 3, 2023
- ULVAC-PHI, INCORPORATED
- Scott R. Bryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS CLUSTER ION BEAM APPARATUS AND ANALYZING APPARATUS
- Publication number 20200312604
- Publication date Oct 1, 2020
- ULVAC-PHI, INC.
- Mauo SOGOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION GUN, AND ANALYSIS INSTRUMENT
- Publication number 20150206732
- Publication date Jul 23, 2015
- ULVAC-PHI, INC.
- Daisuke SAKAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO PROVIDE PARALLEL ACQUISITION OF MASS SPECTR...
- Publication number 20150090874
- Publication date Apr 2, 2015
- ULVAC-PHI, INCORPORATED
- Paul E. Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE
- Publication number 20130016813
- Publication date Jan 17, 2013
- ULVAC-PHI, INC.
- Hiromichi Yamazui
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICAL METHOD
- Publication number 20110064198
- Publication date Mar 17, 2011
- ULVAC, Inc.
- Toshijyu KUNIBE
- G01 - MEASURING TESTING
Information Patent Application
Electron Spectroscopy Analysis Method and Analytical Apparatus
- Publication number 20080042057
- Publication date Feb 21, 2008
- ULVAC-PHI, INC.
- Noriaki Sanada
- G01 - MEASURING TESTING
Information Patent Application
Sample introduction and transfer system and method
- Publication number 20080014056
- Publication date Jan 17, 2008
- ULVAC-PHI, Inc.
- Mark C. Miller
- B82 - NANO-TECHNOLOGY
Information Patent Application
Photoemission electron microscopy and measuring method using the mi...
- Publication number 20050067566
- Publication date Mar 31, 2005
- ULVAC-PHI, INC.
- Takanori Koshikawa
- H01 - BASIC ELECTRIC ELEMENTS

ULVAC-PHI, Inc.

Organization

Patents Grantslast 30 patents

Methods and systems including pulsed dual-beam charge neutralization

Gas cluster ion beam apparatus and analyzing apparatus

Ion source, ion gun, and analysis instrument

Method and apparatus to provide parallel acquisition of mass spectr...

X-ray irradiation device and analysis device

Sample introduction and transfer system and method

Photoemission electron microscopy and measuring method using the mi...

Method of treating metal analysis sample and device thereof

Patents Applicationslast 30 patents

METHODS AND SYSTEMS INCLUDING PULSED DUAL-BEAM CHARGE NEUTRALIZATION

GAS CLUSTER ION BEAM APPARATUS AND ANALYZING APPARATUS

ION SOURCE, ION GUN, AND ANALYSIS INSTRUMENT

METHOD AND APPARATUS TO PROVIDE PARALLEL ACQUISITION OF MASS SPECTR...

X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE

ANALYTICAL METHOD

Electron Spectroscopy Analysis Method and Analytical Apparatus

Sample introduction and transfer system and method

Photoemission electron microscopy and measuring method using the mi...

Trademarklast 30 trademarks