UMCI Ltd.

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Inspecting method of a defect inspection device
- Patent number 7,402,801
- Issue date Jul 22, 2008
- UMCI Ltd.
- Henry Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method of processing semiconductor wafer
- Patent number 7,142,940
- Issue date Nov 28, 2006
- UMCI Ltd.
- Hong Ma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

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