Unitechno Corporation

Organization

Taipei, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Inspection socket
- Patent number 11,619,652
- Issue date Apr 4, 2023
- Unitechno Inc.
- Ryoichi Koeda
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and inspection socket provided with contact probe
- Patent number 11,394,148
- Issue date Jul 19, 2022
- Unitechno Inc.
- Hidekazu Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test apparatus for testing semiconductor devices
- Patent number 10,459,027
- Issue date Oct 29, 2019
- Unitechno, Inc
- Tomoaki Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor transporting and testing fixture
- Patent number 9,529,039
- Issue date Dec 27, 2016
- Unitechno, Inc
- Shinichi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Kelvin contact probe structure and a Kelvin inspection fixture prov...
- Patent number 9,476,912
- Issue date Oct 25, 2016
- Unitechno, Inc
- Shinichi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Video surveillance device with infrared LED
- Patent number 8,253,798
- Issue date Aug 28, 2012
- Unitechno Corporation
- Simon Y. K. Lai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Double ended contact probe
- Patent number 7,598,757
- Issue date Oct 6, 2009
- Unitechno Inc.
- Shinichi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropically conductive sheet
- Patent number 7,446,545
- Issue date Nov 4, 2008
- Unitechno Inc.
- Hitoshi Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Jig device for transporting and testing integrated circuit chip
- Patent number 7,402,995
- Issue date Jul 22, 2008
- Unitechno, Inc
- Tomoaki Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Connector structure for connecting electronic parts
- Patent number 6,942,493
- Issue date Sep 13, 2005
- Unitechno Inc.
- Hitoshi Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connector incorporating an elastic electrically conducti...
- Patent number 6,210,173
- Issue date Apr 3, 2001
- Unitechno Inc.
- Hitoshi Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Connector for electronic parts
- Patent number 6,079,987
- Issue date Jun 27, 2000
- Unitechno, Inc.
- Hitoshi Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Partly replaceable device for testing a multi-contact integrated ci...
- Patent number 5,847,572
- Issue date Dec 8, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Hidekazu Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Test device for multi-contact integrated circuit
- Patent number 5,742,171
- Issue date Apr 21, 1998
- Unitechno, Inc.
- Hitoshi Matsunaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SOCKET
- Publication number 20210405087
- Publication date Dec 30, 2021
- UNITECHNO INC.
- Ryoichi Koeda
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND INSPECTION SOCKET PROVIDED WITH CONTACT PROBE
- Publication number 20210336365
- Publication date Oct 28, 2021
- UNITECHNO INC.
- Hidekazu Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20180106860
- Publication date Apr 19, 2018
- UNITECHNO, INC.
- Tomoaki Adachi
- G01 - MEASURING TESTING
Information Patent Application
KELVIN CONTACT PROBE STRUCTURE AND A KELVIN INSPECTION FIXTURE PROV...
- Publication number 20150160265
- Publication date Jun 11, 2015
- UNITECHNO, INC.
- Shinichi Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Double Ended Contact Probe
- Publication number 20090146672
- Publication date Jun 11, 2009
- UNITECHNO INC.
- Shinichi Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Jig device for transporting and testing integrated circuit chip
- Publication number 20050156166
- Publication date Jul 21, 2005
- UNITECHNO Inc.
- Tomoaki Adachi
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
85405951 - UNITECHNO
- Serial number 85405951
- Registration number 4138188
- Filing date Aug 24, 2011
- UNITECHNO Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Unitechno Corporation

Organization

Patents Grantslast 30 patents

Inspection socket

Contact probe and inspection socket provided with contact probe

Semiconductor test apparatus for testing semiconductor devices

Semiconductor transporting and testing fixture

Kelvin contact probe structure and a Kelvin inspection fixture prov...

Video surveillance device with infrared LED

Double ended contact probe

Anisotropically conductive sheet

Jig device for transporting and testing integrated circuit chip

Connector structure for connecting electronic parts

Electrical connector incorporating an elastic electrically conducti...

Connector for electronic parts

Partly replaceable device for testing a multi-contact integrated ci...

Test device for multi-contact integrated circuit

Patents Applicationslast 30 patents

INSPECTION SOCKET

CONTACT PROBE AND INSPECTION SOCKET PROVIDED WITH CONTACT PROBE

SEMICONDUCTOR INSPECTION DEVICE

KELVIN CONTACT PROBE STRUCTURE AND A KELVIN INSPECTION FIXTURE PROV...

Double Ended Contact Probe

Jig device for transporting and testing integrated circuit chip

Trademarklast 30 trademarks

85405951 - UNITECHNO