UNIVERSITAET ZU LUEBECK

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Luebeck, DE

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Patents Grantslast 30 patents

Information Patent Grant
Fast two-photon imaging by diffracted swept-laser excitation
- Patent number 11,009,459
- Issue date May 18, 2021
- The Regents of the University of California
- Sebastian Karpf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for magnetic particle imaging having unlimited axial field o...
- Patent number 10,338,161
- Issue date Jul 2, 2019
- UNIVERSITAET ZU LUEBECK
- Thorsten Buzug
- G01 - MEASURING TESTING
Information Patent Grant
Device for laser cutting within transparent materials
- Patent number 9,795,511
- Issue date Oct 24, 2017
- Universitaet zu Luebeck
- Alfred Vogel
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cardiac support system and a cardiac support method
- Patent number 9,694,124
- Issue date Jul 4, 2017
- Universitaet zu Luebeck
- Hans-Hinrich Sievers
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for scanning optical interference patterns with line sensors
- Patent number 7,961,333
- Issue date Jun 14, 2011
- Universitaet zu Luebeck
- Gereon Huettmann
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric device
- Patent number 7,480,057
- Issue date Jan 20, 2009
- Universitaet zu Luebeck
- Peter Koch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DOSIMETER MATERIAL FOR AMMONIA AND/OR AMINES, PRODUCTION AND USE OF...
- Publication number 20240201091
- Publication date Jun 20, 2024
- UNIVERSITAET ZU LUEBECK
- Ramtin Rahmanzadeh
- G01 - MEASURING TESTING
Information Patent Application
DOSIMETER MATERIAL FOR AMMONIA AND/OR AMINES, PRODUCTION AND USE OF...
- Publication number 20210310958
- Publication date Oct 7, 2021
- UNIVERSITAET ZU LUEBECK
- Ramtin Rahmanzadeh
- C07 - ORGANIC CHEMISTRY
Information Patent Application
FAST TWO-PHOTON IMAGING BY DIFFRACTED SWEPT-LASER EXCITATION
- Publication number 20190226989
- Publication date Jul 25, 2019
- The Regents of the University of California
- Sebastian Karpf
- G02 - OPTICS
Information Patent Application
A METHOD FOR MAGNETIC PARTICLE IMAGING HAVING UNLIMITED AXIAL FIELD...
- Publication number 20170023651
- Publication date Jan 26, 2017
- UNIVERSITAET ZU LUEBECK
- Thorsten BUZUG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR LASER CUTTING WITHIN TRANSPARENT MATERIALS
- Publication number 20150164689
- Publication date Jun 18, 2015
- UNIVERSITAET ZU LUEBECK
- Alfred Vogel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR DETECTING THE POSITION OF A TRANSDUCER
- Publication number 20140171782
- Publication date Jun 19, 2014
- UNIVERSITAET ZU LUEBECK
- Ralf Bruder
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEVICE AND METHOD FOR MONITORING CRYSTALLIZATION
- Publication number 20130139749
- Publication date Jun 6, 2013
- UNIVERSITAET HAMBURG
- Christian Betzel
- C30 - CRYSTAL GROWTH
Information Patent Application
Method for Scanning Optical Interference Patterns with Line Sensors
- Publication number 20100020328
- Publication date Jan 28, 2010
- UNIVERSITAET ZU LUEBECK
- Gereon Huettmann
- G01 - MEASURING TESTING

UNIVERSITAET ZU LUEBECK

Organization

Patents Grantslast 30 patents

Fast two-photon imaging by diffracted swept-laser excitation

Method for magnetic particle imaging having unlimited axial field o...

Device for laser cutting within transparent materials

Cardiac support system and a cardiac support method

Method for scanning optical interference patterns with line sensors

Interferometric device

Patents Applicationslast 30 patents

DOSIMETER MATERIAL FOR AMMONIA AND/OR AMINES, PRODUCTION AND USE OF...

DOSIMETER MATERIAL FOR AMMONIA AND/OR AMINES, PRODUCTION AND USE OF...

FAST TWO-PHOTON IMAGING BY DIFFRACTED SWEPT-LASER EXCITATION

A METHOD FOR MAGNETIC PARTICLE IMAGING HAVING UNLIMITED AXIAL FIELD...

DEVICE FOR LASER CUTTING WITHIN TRANSPARENT MATERIALS

METHOD FOR DETECTING THE POSITION OF A TRANSDUCER

DEVICE AND METHOD FOR MONITORING CRYSTALLIZATION

Method for Scanning Optical Interference Patterns with Line Sensors

Trademarklast 30 trademarks