Varian Semiconductor Associates, Inc.

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Gloucester, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for analyzing voltage breakdown in electrostatic...
- Patent number 9,417,280
- Issue date Aug 16, 2016
- Varian Semiconductor Associates, Inc.
- David E. Suuronen
- G01 - MEASURING TESTING
Information Patent Grant
LED mesa sidewall isolation by ion implantation
- Patent number 8,664,027
- Issue date Mar 4, 2014
- Varian Semiconductor Associates, Inc.
- San Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for beam density measurement in two dimensions
- Patent number 7,453,070
- Issue date Nov 18, 2008
- Varian Semiconductor Associates, Inc.
- Atul Gupta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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