VEECO METROLOGY INC

Follow

Organization

TUCSON, AZ, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,213,021
- Issue date Jul 3, 2012
- Veeco Metrology, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for utilizing scanning probe shape characteriza...
- Patent number 7,578,176
- Issue date Aug 25, 2009
- Veeco Metrology, Inc.
- Tianming Bao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks