VG Instruments Group Limited

Organization

West Sussex, GB

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Patents Grantslast 30 patents

Information Patent Grant
Glow discharge spectrometry
- Patent number 5,184,016
- Issue date Feb 2, 1993
- VG Instruments Group Limited
- Gerard A. Ronan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for mass spectrometry
- Patent number 5,159,194
- Issue date Oct 27, 1992
- VG Instruments Group Limited
- Philip Marriott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surface analysis
- Patent number 5,146,088
- Issue date Sep 8, 1992
- VG Instruments Group Limited
- David R. Kingham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-focussing mass spectrometer
- Patent number 5,134,287
- Issue date Jul 28, 1992
- VG Instruments Group Limited
- Robert H. Bateman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selectable-resolution charged-particle beam analyzers
- Patent number 5,091,645
- Issue date Feb 25, 1992
- VG Instruments Group Limited
- Richard M. Elliott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution plasma mass spectrometer
- Patent number 5,068,534
- Issue date Nov 26, 1991
- VG Instruments Group Limited
- Neil Bradshaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma mass spectrometer
- Patent number 5,051,584
- Issue date Sep 24, 1991
- VG Instruments Group Limited
- Alan L. Gray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzer
- Patent number 5,036,195
- Issue date Jul 30, 1991
- VG Instruments Group Limited
- Johnathan H. Batey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass spectrometer with independently variable extract...
- Patent number 5,034,605
- Issue date Jul 23, 1991
- VG Instruments Group Limited
- Alan R. Bayly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum evaporation and deposition
- Patent number 5,026,454
- Issue date Jun 25, 1991
- VG Instruments Group Limited
- John J. Parmenter
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Sample treatment apparatus
- Patent number 4,945,774
- Issue date Aug 7, 1990
- VG Instruments Group Limited
- Nigel W. Beard
- C30 - CRYSTAL GROWTH
Information Patent Grant
Mass spectrometer
- Patent number 4,943,718
- Issue date Jul 24, 1990
- VG Instruments Group Limited
- Raymond C. Haines
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Super-critical fluid mass spectrometer
- Patent number 4,942,296
- Issue date Jul 17, 1990
- VG Instruments Group Limited
- David S. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the determination of isotopic composition
- Patent number 4,916,313
- Issue date Apr 10, 1990
- VG Instruments Group Limited
- Keith Hall
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed microfocused ion beams
- Patent number 4,912,327
- Issue date Mar 27, 1990
- VG Instruments Group Limited
- Allen R. Waugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Glow discharge spectrometer
- Patent number 4,912,324
- Issue date Mar 27, 1990
- VG Instruments Group Limited
- Jeremy D. H. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solution analyzing mass spectrometer
- Patent number 4,891,515
- Issue date Jan 2, 1990
- Vg Instruments Group Limited
- David Jones
- G01 - MEASURING TESTING
Information Patent Grant
Bakeable vacuum systems
- Patent number 4,889,319
- Issue date Dec 26, 1989
- VG Instruments Group Limited
- Robert B. Phillips
- C30 - CRYSTAL GROWTH
Information Patent Grant
Mass spectrometer including cooling for the ion collection amplifiers
- Patent number 4,883,957
- Issue date Nov 28, 1989
- VG Instruments Group Limited
- Nigel Kinge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for the determination of isotopic composition
- Patent number 4,866,270
- Issue date Sep 12, 1989
- VG Instruments Group Limited
- Keith Hall
- G01 - MEASURING TESTING
Information Patent Grant
Glow discharge mass spectrometer
- Patent number 4,853,539
- Issue date Aug 1, 1989
- VG Instruments Group Limited
- David J. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-stream fluid sampling valve
- Patent number 4,840,074
- Issue date Jun 20, 1989
- VG Instruments Group Limited
- Paul A. Jessop
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Apparatus for surface analysis
- Patent number 4,829,178
- Issue date May 9, 1989
- VG Instruments Group Limited
- Allen R. Waugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer for positive and negative ions
- Patent number 4,810,882
- Issue date Mar 7, 1989
- VG Instruments Group Limited
- Robert H. Bateman
- G01 - MEASURING TESTING
Information Patent Grant
Discharge ionization mass spectrometer
- Patent number 4,794,252
- Issue date Dec 27, 1988
- VG Instruments Group Limited
- Robert H. Bateman
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometry
- Patent number 4,778,993
- Issue date Oct 18, 1988
- VG Instruments Group Limited
- Allen R. Waugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzer
- Patent number 4,769,542
- Issue date Sep 6, 1988
- VG Instruments Group Limited
- Peter Rockett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 4,760,253
- Issue date Jul 26, 1988
- VG Instruments Group Limited
- Robert C. Hutton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer
- Patent number 4,758,723
- Issue date Jul 19, 1988
- Vg Instruments Group Limited
- Ian R. M. Wardell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum monitoring apparatus
- Patent number 4,755,669
- Issue date Jul 5, 1988
- VG Instruments Group Limited
- Robert B. Grant
- G01 - MEASURING TESTING

VG Instruments Group Limited

Organization

Patents Grantslast 30 patents

Glow discharge spectrometry

Method and apparatus for mass spectrometry

Method and apparatus for surface analysis

Double-focussing mass spectrometer

Selectable-resolution charged-particle beam analyzers

High resolution plasma mass spectrometer

Plasma mass spectrometer

Gas analyzer

Secondary ion mass spectrometer with independently variable extract...

Vacuum evaporation and deposition

Sample treatment apparatus

Mass spectrometer

Super-critical fluid mass spectrometer

Method and apparatus for the determination of isotopic composition

Pulsed microfocused ion beams

Glow discharge spectrometer

Solution analyzing mass spectrometer

Bakeable vacuum systems

Mass spectrometer including cooling for the ion collection amplifiers

Method and apparatus for the determination of isotopic composition

Glow discharge mass spectrometer

Multi-stream fluid sampling valve

Apparatus for surface analysis

Mass spectrometer for positive and negative ions

Discharge ionization mass spectrometer

Time-of-flight mass spectrometry

Charged particle energy analyzer

Mass spectrometer

Electron spectrometer

Vacuum monitoring apparatus