VIEW ENGINEERING, INC

Organization

SIMI VALLEY, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Grid array inspection system and method
- Patent number 5,652,658
- Issue date Jul 29, 1997
- View Engineering, Inc.
- Robert Lea Jackson
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for triangulation-based, 3-D imaging utilizing an...
- Patent number 5,617,209
- Issue date Apr 1, 1997
- View Engineering, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Triangulation-based 3D imaging and processing method and system
- Patent number 5,546,189
- Issue date Aug 13, 1996
- View Engineering, Inc.
- Ronald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis measurement system
- Patent number 4,920,273
- Issue date Apr 24, 1990
- View Engineering, Inc.
- Jack Sacks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing dimensions of can tops during manuf...
- Patent number 4,891,529
- Issue date Jan 2, 1990
- View Engineering, Inc.
- Paul A. Braun
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection system
- Patent number 4,872,052
- Issue date Oct 3, 1989
- View Engineering, Inc.
- Valerie A. Liudzius
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis height measurement system
- Patent number 4,743,771
- Issue date May 10, 1988
- View Engineering, Inc.
- Jack Sacks
- G01 - MEASURING TESTING
Information Patent Grant
High speed pattern recognizer
- Patent number 4,736,437
- Issue date Apr 5, 1988
- View Engineering, Inc.
- Jack Sacks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for illuminating objects for vision systems
- Patent number 4,706,168
- Issue date Nov 10, 1987
- View Engineering, Inc.
- Ralph M. Weisner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring properties of cylindrical objects
- Patent number 4,658,633
- Issue date Apr 21, 1987
- View Engineering, Inc.
- Edgar P. Freer
- G01 - MEASURING TESTING
Information Patent Grant
Pattern recognition apparatus and method
- Patent number 4,385,322
- Issue date May 24, 1983
- View Engineering, Inc.
- Richard A. Hubach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive video processor
- Patent number 4,300,164
- Issue date Nov 10, 1981
- View Engineering, Inc.
- Jack Sacks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern recognition apparatus and method
- Patent number 4,200,861
- Issue date Apr 29, 1980
- View Engineering, Inc.
- Richard A. Hubach
- G06 - COMPUTING CALCULATING COUNTING

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Trademarklast 30 trademarks

Information Trademark
78053445 - VIEW SUMMIT
- Serial number 78053445
- Registration number 2765583
- Filing date Mar 16, 2001
- View Engineering, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

VIEW ENGINEERING, INC

Organization

Patents Grantslast 30 patents

Grid array inspection system and method

Method and system for triangulation-based, 3-D imaging utilizing an...

Triangulation-based 3D imaging and processing method and system

Z-axis measurement system

System and method for analyzing dimensions of can tops during manuf...

Semiconductor device inspection system

Z-axis height measurement system

High speed pattern recognizer

Systems and methods for illuminating objects for vision systems

Apparatus and method for measuring properties of cylindrical objects

Pattern recognition apparatus and method

Adaptive video processor

Pattern recognition apparatus and method

Trademarklast 30 trademarks

78053445 - VIEW SUMMIT