Vistec Semiconductor System GmbH

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Weilburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Advancing means for a multi-coordinate measurement table of a coord...
- Patent number 8,056,434
- Issue date Nov 15, 2011
- Vistec Semiconductor Systems, GmbH
- Tillman Ehrenberg
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for determining an optical property of a mask
- Patent number 7,864,319
- Issue date Jan 4, 2011
- Vistec Semiconductor System GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Illumination means and inspection means having an illumination means
- Publication number 20090086483
- Publication date Apr 2, 2009
- Vistec Semiconductor System GmbH
- Kurt Hahn
- G01 - MEASURING TESTING