Wafer Tech

Follow

Organization

Camas, WA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Non-intrusive pellicle height measurement system
- Patent number 6,459,491
- Issue date Oct 1, 2002
- Wafer Tech
- Phong T. Nguyen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY