Wavecrest Corporation

Organization

Edina, MN, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for recording a real time signal
- Patent number 7,305,312
- Issue date Dec 4, 2007
- Wavecrest Corporation
- John David Hamre
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing a distribution
- Patent number 7,016,805
- Issue date Mar 21, 2006
- Wavecrest Corporation
- Jie Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining system response characteristics
- Patent number 6,813,589
- Issue date Nov 2, 2004
- Wavecrest Corporation
- Mike Peng Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing measurements
- Patent number 6,799,144
- Issue date Sep 28, 2004
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis of noise in repetitive waveforms
- Patent number 6,449,570
- Issue date Sep 10, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system with a frequency-dividing edge counter
- Patent number 6,393,088
- Issue date May 21, 2002
- Wavecrest Corporation
- Mark J. Emineth
- G04 - HOROLOGY
Information Patent Grant
Method and apparatus for jitter analysis
- Patent number 6,356,850
- Issue date Mar 12, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing measurements
- Patent number 6,298,315
- Issue date Oct 2, 2001
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time interval measurement system incorporating a linear ramp genera...
- Patent number 6,194,925
- Issue date Feb 27, 2001
- Wavecrest Corporation
- Christopher Kimsal
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of noise in repetitive waveforms
- Patent number 6,185,509
- Issue date Feb 6, 2001
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for removal of frequency-dependent timing distortion
- Publication number 20090045863
- Publication date Feb 19, 2009
- Wavecrest Corporation
- Steve McCoy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR A REAL TIME SIGNAL INTEGRITY OSCILLOSCOPE
- Publication number 20080043583
- Publication date Feb 21, 2008
- Wavecrest Corporation
- John David HAMRE
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing measurements
- Publication number 20050027477
- Publication date Feb 3, 2005
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electromagnetic and optical analyzer
- Publication number 20040001194
- Publication date Jan 1, 2004
- Wavecrest Corporation
- Jan Brian Wilstrup
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining system response characteristics
- Publication number 20030098696
- Publication date May 29, 2003
- Wavecrest Corporation
- Mike Peng Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for jitter analysis
- Publication number 20020120420
- Publication date Aug 29, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing measurements
- Publication number 20010044704
- Publication date Nov 22, 2001
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Time interval measurement system incorporating a linear ramp genera...
- Publication number 20010028262
- Publication date Oct 11, 2001
- Wavecrest Corporation
- Christopher Kimsal
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77111179 - SCOPEMAX
- Serial number 77111179
- Filing date Feb 20, 2007
- Wavecrest Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78140473 - PLOT INTERPRETER
- Serial number 78140473
- Filing date Jul 1, 2002
- Wavecrest Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75441231
- Serial number 75441231
- Registration number 2242742
- Filing date Feb 26, 1998
- Wavecrest Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Wavecrest Corporation

Organization

Patents Grantslast 30 patents

Method and apparatus for recording a real time signal

Method and apparatus for analyzing a distribution

Method and apparatus for determining system response characteristics

Method and apparatus for analyzing measurements

Analysis of noise in repetitive waveforms

Measurement system with a frequency-dividing edge counter

Method and apparatus for jitter analysis

Method and apparatus for analyzing measurements

Time interval measurement system incorporating a linear ramp genera...

Analysis of noise in repetitive waveforms

Patents Applicationslast 30 patents

System and method for removal of frequency-dependent timing distortion

METHOD AND APPARATUS FOR A REAL TIME SIGNAL INTEGRITY OSCILLOSCOPE

Method and apparatus for analyzing measurements

Electromagnetic and optical analyzer

Method and apparatus for determining system response characteristics

Method and apparatus for jitter analysis

Method and apparatus for analyzing measurements

Time interval measurement system incorporating a linear ramp genera...

Trademarklast 30 trademarks

77111179 - SCOPEMAX

78140473 - PLOT INTERPRETER

75441231