WILLTECHNOLOGY CO., LTD.

Follow

Organization

Gyeonggi-do, KR

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing apparatus
- Patent number 10,928,422
- Issue date Feb 23, 2021
- WILLTECHNOLOGY CO., LTD.
- Il Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NEEDLE BLOCK FOR EASY ADJUSTMENT OF TIP LENGTH OF NEEDLE UNIT
- Publication number 20240077518
- Publication date Mar 7, 2024
- WILLTECHNOLOGY CO., LTD.
- Song Yeon WI
- G01 - MEASURING TESTING
Information Patent Application
Probe substrate and probe card having the same
- Publication number 20090260459
- Publication date Oct 22, 2009
- WILLTECHNOLOGY CO., LTD.
- Hongchan Kim
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20090261850
- Publication date Oct 22, 2009
- WILLTECHNOLOGY CO., LTD.
- Hongchan Kim
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20080265920
- Publication date Oct 30, 2008
- WILLTECHNOLOGY CO., LTD.
- Ki Don Ko
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20080186042
- Publication date Aug 7, 2008
- WILLTECHNOLOGY CO., LTD.
- Ki Don Ko
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND STRUCTURE FOR FIXING NEEDLE THEREOF
- Publication number 20080186037
- Publication date Aug 7, 2008
- WILLTECHNOLOGY CO., LTD.
- Ki Don Ko
- G01 - MEASURING TESTING

Trademarklast 30 trademarks