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WINWAY TECHNOLOGY CO., LTD

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  • NANZIH DIST, TW
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electronic test device
    • Patent number 11,215,642
    • Issue date Jan 4, 2022
    • Winway Technology Co., Ltd.
    • Kuan-Chung Chen
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing method for testing wafer level chip scale packages
    • Patent number 10,566,256
    • Issue date Feb 18, 2020
    • Winway Technology Co., Ltd.
    • Kuan-Chung Chen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electronic test apparatus
    • Patent number 10,466,299
    • Issue date Nov 5, 2019
    • Winway Technology Co., Ltd.
    • Kuan-Chung Chen
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test signals conduction device
    • Patent number 10,281,489
    • Issue date May 7, 2019
    • Winway Technology Co., Ltd.
    • Chyi-Lang Lai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wafer probe card
    • Patent number 8,901,948
    • Issue date Dec 2, 2014
    • Winway Technology Co., Ltd.
    • Chia-Huang Wang
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST SOCKET
    • Publication number 20240319227
    • Publication date Sep 26, 2024
    • WINWAY TECHNOLOGY CO., LTD.
    • Po-Han YEH
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PROBE
    • Publication number 20210389347
    • Publication date Dec 16, 2021
    • WINWAY TECHNOLOGY CO., LTD.
    • Chyi-Lang LAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC TEST DEVICE
    • Publication number 20210278440
    • Publication date Sep 9, 2021
    • WINWAY TECHNOLOGY CO., LTD.
    • Kuan-Chung CHEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING METHOD FOR TESTING WAFER LEVEL CHIP SCALE PACKAGES
    • Publication number 20190206750
    • Publication date Jul 4, 2019
    • WINWAY TECHNOLOGY CO., LTD.
    • Kuan-Chung CHEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC TEST APPARATUS
    • Publication number 20190204379
    • Publication date Jul 4, 2019
    • WINWAY TECHNOLOGY CO., LTD.
    • Kuan-Chung CHEN
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks

  • Information Trademark

    86621203 - WINWAY TECHNOLOGY
    • Serial number 86621203
    • Registration number 5047788
    • Filing date May 6, 2015
    • WINWAY TECHNOLOGY CO., LTD.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments