X-Ray Optical System, Inc.

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Voorheesville, NY, US

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Information Patent Grant
X-ray fluorescence system with apertured mask for analyzing pattern...
- Patent number 7,023,955
- Issue date Apr 4, 2006
- X-Ray Optical System, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Use of a Kumakhov lens for X-ray lithography
- Patent number 5,175,755
- Issue date Dec 29, 1992
- X-Ray Optical System, Inc.
- Muradin A. Kumakhov
- B82 - NANO-TECHNOLOGY

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