X-RAY OPTICAL SYSTEMS, INC.

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Albany, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Sample handling apparatus for pressurized fluids and X-ray analyzer...
- Patent number 10,705,033
- Issue date Jul 7, 2020
- X-Ray Optical Systems, Inc.
- Joseph J Spinazola
- G01 - MEASURING TESTING
Information Patent Grant
Active, variable sample concentration method and apparatus for sub-...
- Patent number 10,317,350
- Issue date Jun 11, 2019
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Support structure and highly aligned monochromatic X-ray optics for...
- Patent number 10,256,002
- Issue date Apr 9, 2019
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Mobile transport and shielding apparatus for removable x-ray analyzer
- Patent number 9,633,753
- Issue date Apr 25, 2017
- X-Ray Optical Systems, Inc.
- Steven M. Pomerantz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Portable X-ray analyzer having vibration, thermal and/or moisture i...
- Patent number 9,521,735
- Issue date Dec 13, 2016
- X-Ray Optical Systems, Inc.
- Daniel Dunham
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer having multiple excitation energy bands produced usi...
- Patent number 9,449,780
- Issue date Sep 20, 2016
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Sample viscosity and flow control for heavy samples, and X-ray anal...
- Patent number 9,435,757
- Issue date Sep 6, 2016
- X-Ray Optical Systems, Inc.
- George Allen
- G01 - MEASURING TESTING
Information Patent Grant
Online monitoring of contaminants in crude and heavy fuels, and ref...
- Patent number 9,383,326
- Issue date Jul 5, 2016
- X-Ray Optical Systems, Inc.
- Albertus Beumer
- G01 - MEASURING TESTING
Information Patent Grant
Non-homogeneous sample handling apparatus and X-ray analyzer applic...
- Patent number 9,360,440
- Issue date Jun 7, 2016
- X-Ray Optical Systems, Inc.
- George Allen
- G01 - MEASURING TESTING
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,343,193
- Issue date May 17, 2016
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Mobile transport and shielding apparatus for removable x-ray analyzer
- Patent number 9,335,280
- Issue date May 10, 2016
- X-Ray Optical Systems, Inc.
- Steven M. Pomerantz
- G01 - MEASURING TESTING
Information Patent Grant
Sample viscosity and flow control for heavy samples, and X-ray anal...
- Patent number 9,057,685
- Issue date Jun 16, 2015
- X-Ray Optical Systems, Inc.
- George Allen
- G01 - MEASURING TESTING
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,048,001
- Issue date Jun 2, 2015
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Compositions, methods of use and systems for analysis of silicon le...
- Patent number 8,908,827
- Issue date Dec 9, 2014
- X-Ray Optical Systems, Inc.
- James Carnahan
- G01 - MEASURING TESTING
Information Patent Grant
Sample module with sample stream supported and spaced from window,...
- Patent number 8,625,737
- Issue date Jan 7, 2014
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Handheld x-ray analyzer
- Patent number D697210
- Issue date Jan 7, 2014
- X-Ray Optical Systems, Inc.
- Rory D. Delaney
- D24 - Medical and laboratory equipment
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 8,559,597
- Issue date Oct 15, 2013
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Compact, low noise power supply for advanced electronics applicatio...
- Patent number 8,553,841
- Issue date Oct 8, 2013
- X-Ray Optical Systems, Inc.
- Ernest Cooley
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray diffraction apparatus and technique for measuring grain orien...
- Patent number 8,130,908
- Issue date Mar 6, 2012
- X-Ray Optical Systems, Inc.
- Huapeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Sample module with sample stream spaced from window, for x-ray anal...
- Patent number 8,050,382
- Issue date Nov 1, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Monochromatic x-ray micro beam for trace element mapping
- Patent number 7,991,116
- Issue date Aug 2, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Small spot and high energy resolution XRF system for valence state...
- Patent number 7,899,154
- Issue date Mar 1, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Sliding sample cell insertion and removal apparatus for x-ray analyzer
- Patent number 7,873,143
- Issue date Jan 18, 2011
- X-Ray Optical Systems, Inc.
- Daniel L. Dunham
- G01 - MEASURING TESTING
Information Patent Grant
Sample cell for x-ray analyzer
- Patent number D628709
- Issue date Dec 7, 2010
- X-Ray Optical Systems, Inc.
- John H. Burdett, Jr.
- D24 - Medical and laboratory equipment
Information Patent Grant
Highly aligned x-ray optic and source assembly for precision x-ray...
- Patent number 7,738,630
- Issue date Jun 15, 2010
- X-Ray Optical Systems, Inc.
- John H. Burdett, Jr.
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray focusing optic having multiple layers with respective crystal...
- Patent number 7,738,629
- Issue date Jun 15, 2010
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Shielded sample cell insertion and removal apparatus for X-ray anal...
- Patent number 7,738,628
- Issue date Jun 15, 2010
- X-Ray Optical Systems, Inc.
- Rory D. Delaney
- G01 - MEASURING TESTING
Information Patent Grant
Pre-filmed precision sample cell for x-ray analyzer
- Patent number 7,729,471
- Issue date Jun 1, 2010
- X-Ray Optical Systems, Inc.
- John H. Burdett, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for X-ray diffraction measurements using an align...
- Patent number 7,711,088
- Issue date May 4, 2010
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging systems employing point-focusing, curved monochromati...
- Patent number 7,583,789
- Issue date Sep 1, 2009
- The Research Foundation of State University of New York
- Carolyn A. MacDonald
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD
- Publication number 20240035990
- Publication date Feb 1, 2024
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE ASSEMBLY WITH ENHANCED TEMPERATURE CONTROL FOR OUTPUT...
- Publication number 20220201830
- Publication date Jun 23, 2022
- X-Ray Optical Systems, Inc.
- Ernest COOLEY
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER...
- Publication number 20190056337
- Publication date Feb 21, 2019
- X-Ray Optical Systems, Inc.
- Joseph J SPINAZOLA
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATIC X-RAY OPTICS FOR...
- Publication number 20170110212
- Publication date Apr 20, 2017
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...
- Publication number 20170097311
- Publication date Apr 6, 2017
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLI...
- Publication number 20160274042
- Publication date Sep 22, 2016
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20160260514
- Publication date Sep 8, 2016
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
MOBILE TRANSPORT AND SHIELDING APPARATUS FOR REMOVABLE X-RAY ANALYZER
- Publication number 20160254068
- Publication date Sep 1, 2016
- X-Ray Optical Systems, Inc.
- Steven M. POMERANTZ
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VISCOSITY AND FLOW CONTROL FOR HEAVY SAMPLES, AND X-RAY ANAL...
- Publication number 20160033428
- Publication date Feb 4, 2016
- X-Ray Optical Systems, Inc.
- George ALLEN
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20150262722
- Publication date Sep 17, 2015
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USI...
- Publication number 20150043713
- Publication date Feb 12, 2015
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE X-RAY ANALYZER HAVING VIBRATION, THERMAL AND/OR MOISTURE I...
- Publication number 20150036804
- Publication date Feb 5, 2015
- X-Ray Optical Systems, Inc.
- Daniel Dunham
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATING X-RAY OPTICS FO...
- Publication number 20140294157
- Publication date Oct 2, 2014
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
NON-HOMOGENEOUS SAMPLE HANDLING APPARATUS AND X-RAY ANALYZER APPLIC...
- Publication number 20140270063
- Publication date Sep 18, 2014
- X-Ray Optical Systems, Inc.
- George ALLEN
- G01 - MEASURING TESTING
Information Patent Application
ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REF...
- Publication number 20140198898
- Publication date Jul 17, 2014
- X-Ray Optical Systems, Inc.
- Albertus Beumer
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20140105363
- Publication date Apr 17, 2014
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VISCOSITY AND FLOW CONTROL FOR HEAVY SAMPLES, AND X-RAY ANAL...
- Publication number 20130044858
- Publication date Feb 21, 2013
- X-Ray Optical Systems, Inc.
- George ALLEN
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LE...
- Publication number 20120321045
- Publication date Dec 20, 2012
- X-Ray Optical Systems, Inc.
- James CARNAHAN
- G01 - MEASURING TESTING
Information Patent Application
COMPACT, LOW NOISE POWER SUPPLY FOR ADVANCED ELECTRONICS APPLICATIO...
- Publication number 20120020463
- Publication date Jan 26, 2012
- X-Ray Optical Systems, Inc.
- Ernest COOLEY
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SAMPLE MODULE WITH SAMPLE STREAM SUPPORTED AND SPACED FROM WINDOW,...
- Publication number 20110194671
- Publication date Aug 11, 2011
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20110170666
- Publication date Jul 14, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIEN...
- Publication number 20110038457
- Publication date Feb 17, 2011
- X-Ray Optical Systems, Inc.
- Huapeng HUANG
- G01 - MEASURING TESTING
Information Patent Application
SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE...
- Publication number 20100046702
- Publication date Feb 25, 2010
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING SYSTEMS EMPLOYING POINT-FOCUSING, CURVED MONOCHROMATI...
- Publication number 20090225947
- Publication date Sep 10, 2009
- X-Ray Optical Systems, Inc.
- Carolyn A. MacDonald
- B82 - NANO-TECHNOLOGY
Information Patent Application
HIGHLY ALIGNED X-RAY OPTIC AND SOURCE ASSEMBLY FOR PRECISION X-RAY...
- Publication number 20090225948
- Publication date Sep 10, 2009
- X-Ray Optical Systems, Inc.
- John H. BURDETT, JR.
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE MODULE WITH SAMPLE STREAM SPACED FROM WINDOW, FOR X-RAY ANAL...
- Publication number 20090213988
- Publication date Aug 27, 2009
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING
- Publication number 20090161829
- Publication date Jun 25, 2009
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED SAMPLE CELL INSERTION AND REMOVAL APPARATUS FOR X-RAY ANAL...
- Publication number 20090141865
- Publication date Jun 4, 2009
- X-Ray Optical Systems, Inc.
- Rory D. DELANEY
- G01 - MEASURING TESTING
Information Patent Application
PRE-FILMED PRECISION SAMPLE CELL FOR X-RAY ANALYZER
- Publication number 20090141867
- Publication date Jun 4, 2009
- X-Ray Optical Systems, Inc.
- John H. BURDETT, JR.
- G01 - MEASURING TESTING
Information Patent Application
SLIDING SAMPLE CELL INSERTION AND REMOVAL APPARATUS FOR X-RAY ANALYZER
- Publication number 20090141862
- Publication date Jun 4, 2009
- X-Ray Optical Systems, Inc.
- Daniel L. DUNHAM
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
98542517 - PETRA
- Serial number 98542517
- Filing date May 9, 2024
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97782035 - ACCUCELLS
- Serial number 97782035
- Registration number 7315122
- Filing date Feb 6, 2023
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87118418 - FLEX-BEAM
- Serial number 87118418
- Registration number 5387591
- Filing date Jul 27, 2016
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86541272 - HD ROCKSAND
- Serial number 86541272
- Registration number 5078688
- Filing date Feb 20, 2015
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86534104 - HD ROXY
- Serial number 86534104
- Filing date Feb 13, 2015
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85557262 - HD MOBILE
- Serial number 85557262
- Registration number 4515184
- Filing date Mar 1, 2012
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85443191 - HDMOBILE
- Serial number 85443191
- Filing date Oct 10, 2011
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85067680 - SIGNAL
- Serial number 85067680
- Registration number 4119161
- Filing date Jun 21, 2010
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85067673 - HD PRIME
- Serial number 85067673
- Registration number 4057178
- Filing date Jun 21, 2010
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85067666 - HD MAXINE
- Serial number 85067666
- Registration number 3987080
- Filing date Jun 21, 2010
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85054640 - HD EQUITY
- Serial number 85054640
- Filing date Jun 4, 2010
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77356597 - HDXRF
- Serial number 77356597
- Registration number 3843485
- Filing date Dec 20, 2007
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77289560 - HD XRF
- Serial number 77289560
- Registration number 3915246
- Filing date Sep 26, 2007
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77136529 - CLORA
- Serial number 77136529
- Registration number 3406305
- Filing date Mar 21, 2007
- X-Ray Optical Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76372322 - SINDIE
- Serial number 76372322
- Registration number 2758158
- Filing date Feb 19, 2002
- X-Ray Optical Systems, Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76017808 - X-BEAM
- Serial number 76017808
- Registration number 2650094
- Filing date Apr 4, 2000
- X-Ray Optical Systems, Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75544296 - XOS
- Serial number 75544296
- Registration number 2295716
- Filing date Aug 27, 1998
- X-Ray Optical Systems, Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75530547 - X-RAY OPTICAL SYSTEMS
- Serial number 75530547
- Filing date Aug 4, 1998
- X-Ray Optical Systems, Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

X-RAY OPTICAL SYSTEMS, INC.

Organization

Patents Grantslast 30 patents

Sample handling apparatus for pressurized fluids and X-ray analyzer...

Active, variable sample concentration method and apparatus for sub-...

Support structure and highly aligned monochromatic X-ray optics for...

Mobile transport and shielding apparatus for removable x-ray analyzer

Portable X-ray analyzer having vibration, thermal and/or moisture i...

X-ray analyzer having multiple excitation energy bands produced usi...

Sample viscosity and flow control for heavy samples, and X-ray anal...

Online monitoring of contaminants in crude and heavy fuels, and ref...

Non-homogeneous sample handling apparatus and X-ray analyzer applic...

XRF system having multiple excitation energy bands in highly aligne...

Mobile transport and shielding apparatus for removable x-ray analyzer

Sample viscosity and flow control for heavy samples, and X-ray anal...

XRF system having multiple excitation energy bands in highly aligne...

Compositions, methods of use and systems for analysis of silicon le...

Sample module with sample stream supported and spaced from window,...

Handheld x-ray analyzer

XRF system having multiple excitation energy bands in highly aligne...

Compact, low noise power supply for advanced electronics applicatio...

X-ray diffraction apparatus and technique for measuring grain orien...

Sample module with sample stream spaced from window, for x-ray anal...

Monochromatic x-ray micro beam for trace element mapping

Small spot and high energy resolution XRF system for valence state...

Sliding sample cell insertion and removal apparatus for x-ray analyzer

Sample cell for x-ray analyzer

Highly aligned x-ray optic and source assembly for precision x-ray...

X-ray focusing optic having multiple layers with respective crystal...

Shielded sample cell insertion and removal apparatus for X-ray anal...

Pre-filmed precision sample cell for x-ray analyzer

Method and system for X-ray diffraction measurements using an align...

X-ray imaging systems employing point-focusing, curved monochromati...

Patents Applicationslast 30 patents

POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD

X-RAY SOURCE ASSEMBLY WITH ENHANCED TEMPERATURE CONTROL FOR OUTPUT...

SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER...

SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATIC X-RAY OPTICS FOR...

ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...

NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLI...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

MOBILE TRANSPORT AND SHIELDING APPARATUS FOR REMOVABLE X-RAY ANALYZER

SAMPLE VISCOSITY AND FLOW CONTROL FOR HEAVY SAMPLES, AND X-RAY ANAL...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USI...

PORTABLE X-RAY ANALYZER HAVING VIBRATION, THERMAL AND/OR MOISTURE I...

SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATING X-RAY OPTICS FO...

NON-HOMOGENEOUS SAMPLE HANDLING APPARATUS AND X-RAY ANALYZER APPLIC...

ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REF...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

SAMPLE VISCOSITY AND FLOW CONTROL FOR HEAVY SAMPLES, AND X-RAY ANAL...

COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LE...

COMPACT, LOW NOISE POWER SUPPLY FOR ADVANCED ELECTRONICS APPLICATIO...

SAMPLE MODULE WITH SAMPLE STREAM SUPPORTED AND SPACED FROM WINDOW,...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIEN...

SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE...

X-RAY IMAGING SYSTEMS EMPLOYING POINT-FOCUSING, CURVED MONOCHROMATI...

HIGHLY ALIGNED X-RAY OPTIC AND SOURCE ASSEMBLY FOR PRECISION X-RAY...

SAMPLE MODULE WITH SAMPLE STREAM SPACED FROM WINDOW, FOR X-RAY ANAL...

MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING

SHIELDED SAMPLE CELL INSERTION AND REMOVAL APPARATUS FOR X-RAY ANAL...

PRE-FILMED PRECISION SAMPLE CELL FOR X-RAY ANALYZER

SLIDING SAMPLE CELL INSERTION AND REMOVAL APPARATUS FOR X-RAY ANALYZER

Trademarklast 30 trademarks

98542517 - PETRA

97782035 - ACCUCELLS

87118418 - FLEX-BEAM

86541272 - HD ROCKSAND

86534104 - HD ROXY

85557262 - HD MOBILE

85443191 - HDMOBILE

85067680 - SIGNAL

85067673 - HD PRIME

85067666 - HD MAXINE

85054640 - HD EQUITY

77356597 - HDXRF

77289560 - HD XRF

77136529 - CLORA

76372322 - SINDIE