XERTEX CORPORATION

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MENLO PARK, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Organic spill monitor
- Patent number 4,749,657
- Issue date Jun 7, 1988
- Xertex Corporation
- Yoshihiro Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
X-Ray fluorescence spectrometer and method of calibrating the same
- Patent number 4,577,338
- Issue date Mar 18, 1986
- Xertex Corporation
- Yoshihiro Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Sulfur dioxide analysis system
- Patent number 4,569,918
- Issue date Feb 11, 1986
- Xertex Corporation
- Robert T. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Determination of total carbon in liquid samples
- Patent number 4,344,918
- Issue date Aug 17, 1982
- Xertex Corporation
- Yoshihiro Takahashi
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
73349052 - XERTEX
- Serial number 73349052
- Registration number 1220706
- Filing date Feb 8, 1982
- Xertex Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments