Membership
Tour
Register
Log in
XINIX, INC.
Follow
Organization
ELLICOTT CITY, MD, US
Organizations
Overview
Industries
People
People
Information
Transactions
Events
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Interference removal
Patent number
5,414,504
Issue date
May 9, 1995
Xinix, Inc.
Herbert E. Litvak
G01 - MEASURING TESTING
Information
Patent Grant
Method for control of photoresist develop processes
Patent number
5,292,605
Issue date
Mar 8, 1994
Xinix, Inc.
Mariste A. Thomson
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Interference removal
Patent number
5,208,644
Issue date
May 4, 1993
Xinix, Inc.
Herbert E. Litvak
G01 - MEASURING TESTING
Information
Patent Grant
Method for control of photoresist develop processes
Patent number
5,196,285
Issue date
Mar 23, 1993
Xinix, Inc.
Mariste A. Thomson
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Through the wafer optical transmission sensor
Patent number
5,166,525
Issue date
Nov 24, 1992
Xinix, Inc.
Edward G. Rodgers
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for monitoring radiant energy signals with var...
Patent number
5,138,149
Issue date
Aug 11, 1992
Xinix, Inc.
Raymond J. Cadet
G01 - MEASURING TESTING
Information
Patent Grant
Light collection method and apparatus
Patent number
5,064,269
Issue date
Nov 12, 1991
Xinix, Inc.
Edward G. Rogers
G02 - OPTICS
Information
Patent Grant
Method and apparatus for monitoring particles using back-scattered...
Patent number
5,012,119
Issue date
Apr 30, 1991
Xinix, Inc.
Walter Rhiner
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Trademark
last 30 trademarks