XITRONIX CORPORATION

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of z-scan photoreflectance characterization
- Patent number 8,300,227
- Issue date Oct 30, 2012
- Xitronix Corporation
- William W. Chism, II
- G01 - MEASURING TESTING
Information Patent Grant
Method of photo-reflectance characterization of strain and active d...
- Patent number 7,391,507
- Issue date Jun 24, 2008
- Xitronix Corporation
- William W. Chism, II
- G01 - MEASURING TESTING
Information Patent Grant
Polarization modulation photoreflectance characterization of semico...
- Patent number 7,239,392
- Issue date Jul 3, 2007
- Xitronix Corporation
- William W. Chism, II
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS OF Z-SCAN PHOTOREFLECTANCE CHARACTERIZATION
- Publication number 20120327420
- Publication date Dec 27, 2012
- Xitronix Corporation
- William W. CHISM, II
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Z-Scan Photoreflectance Characterization
- Publication number 20100315646
- Publication date Dec 16, 2010
- XITRONIX CORPORATION
- William W. CHISM, II
- G01 - MEASURING TESTING