Xnovo Technology ApS

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Koge, DK

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Patents Grantslast 30 patents

Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,288,570
- Issue date May 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,139,357
- Issue date Nov 27, 2018
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory x-ray micro-tomography system with crystallographic grai...
- Patent number 9,110,004
- Issue date Aug 18, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CARRYING OUT POLARIZATION RESOLVED RAMAN SPECTROSCOPY
- Publication number 20230003576
- Publication date Jan 5, 2023
- Danmarks Tekniske Universitet
- Oleksii ILCHENKO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20190079032
- Publication date Mar 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20170038317
- Publication date Feb 9, 2017
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING

Trademarklast 30 trademarks