Xradia, Inc.

Organization

Beijing, CN

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Compound X-ray lens having multiple aligned zone plates
- Patent number 8,526,575
- Issue date Sep 3, 2013
- Xradia, Inc.
- Alan Francis Lyon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for tomographic projection correction
- Patent number 8,353,628
- Issue date Jan 15, 2013
- Xradia, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment assembly
- Patent number 8,267,388
- Issue date Sep 18, 2012
- Xradia, Inc.
- Ying Xu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Verification of integrated circuits against malicious circuit inser...
- Patent number 8,139,846
- Issue date Mar 20, 2012
- University of Southern California
- Michael A. Bajura
- G01 - MEASURING TESTING
Information Patent Grant
Process for examining mineral samples with X-ray microscope and pro...
- Patent number 8,068,579
- Issue date Nov 29, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Metrology and registration system and method for laminography and t...
- Patent number 7,974,379
- Issue date Jul 5, 2011
- Xradia, Inc.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Grant
CD-GISAXS system and method
- Patent number 7,920,676
- Issue date Apr 5, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
High aspect-ratio X-ray diffractive structure stabilization methods...
- Patent number 7,864,426
- Issue date Jan 4, 2011
- Xradia, Inc.
- Wenbing Yun
- G02 - OPTICS
Information Patent Grant
X-ray microscope with switchable x-ray source
- Patent number 7,813,475
- Issue date Oct 12, 2010
- Xradia, Inc.
- Ziyu Wu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Low pass X-ray scintillator system
- Patent number 7,800,072
- Issue date Sep 21, 2010
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for switching sources in x-ray microscope
- Patent number 7,796,725
- Issue date Sep 14, 2010
- Xradia, Inc.
- Ziyu Wu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for quantitative reconstruction of Zernike phase-...
- Patent number 7,787,588
- Issue date Aug 31, 2010
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray micro-tomography system optimized for high resolution, throug...
- Patent number 7,561,662
- Issue date Jul 14, 2009
- Xradia, Inc.
- Yuxin Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Five axis compensated rotating stage
- Patent number 7,535,193
- Issue date May 19, 2009
- Xradia, Inc.
- Ying Xu
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for fuel cell material x-ray analysis
- Patent number 7,499,521
- Issue date Mar 3, 2009
- Xradia, Inc.
- Yuxin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Structured anode X-ray source for X-ray microscopy
- Patent number 7,443,953
- Issue date Oct 28, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Phase contrast microscope for short wavelength radiation and imagin...
- Patent number 7,414,787
- Issue date Aug 19, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray mammography
- Patent number 7,412,024
- Issue date Aug 12, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray microscope with microfocus source and Wolter condenser
- Patent number 7,406,151
- Issue date Jul 29, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High resolution direct-projection type x-ray microtomography system...
- Patent number 7,400,704
- Issue date Jul 15, 2008
- Xradia, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optimized x-ray energy for high resolution imaging of integrated ci...
- Patent number 7,394,890
- Issue date Jul 1, 2008
- Xradia, Inc.
- Yuxin Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray micro-tomography system optimized for high resolution, throug...
- Patent number 7,388,942
- Issue date Jun 17, 2008
- Xradia, Inc.
- Yuxin Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Fabrication methods for micro compounds optics
- Patent number 7,365,909
- Issue date Apr 29, 2008
- Xradia, Inc.
- Wenbing Yun
- G02 - OPTICS
Information Patent Grant
Fast x-ray lenses and fabrication method therefor
- Patent number 7,365,918
- Issue date Apr 29, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Lens bonded X-ray scintillator system and manufacturing method ther...
- Patent number 7,297,959
- Issue date Nov 20, 2007
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Dual-band detector system for x-ray imaging of biological samples
- Patent number 7,286,640
- Issue date Oct 23, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Short wavelength metrology imaging system
- Patent number 7,268,945
- Issue date Sep 11, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Element-specific X-ray fluorescence microscope and method of operation
- Patent number 7,245,696
- Issue date Jul 17, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray micro-tomography system optimized for high resolution, throug...
- Patent number 7,215,736
- Issue date May 8, 2007
- Xradia, Inc.
- Yuxin Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Element-specific X-ray fluorescence microscope and method of operation
- Patent number 7,183,547
- Issue date Feb 27, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20140233692
- Publication date Aug 21, 2014
- XRADIA, INC.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION OF INTEGRATED CIRCUITS AGAINST MALICIOUS CIRCUIT INSER...
- Publication number 20110002528
- Publication date Jan 6, 2011
- University of Southern California
- Michael A. Bajura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Alignment Assembly
- Publication number 20090067976
- Publication date Mar 12, 2009
- Xradia, Inc.
- Ying Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Five Axis Compensated Rotating Stage
- Publication number 20080309276
- Publication date Dec 18, 2008
- Xradia, Inc.
- Ying Xu
- G05 - CONTROLLING REGULATING
Information Patent Application
CD-GISAXS System and Method
- Publication number 20080273662
- Publication date Nov 6, 2008
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Micro-Tomography System Optimized for High Resolution, Throug...
- Publication number 20080205734
- Publication date Aug 28, 2008
- Xradia, Inc.
- Yuxin Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
High Aspect-Ratio X-Ray Diffractive Structure Stabilization Methods...
- Publication number 20080192347
- Publication date Aug 14, 2008
- Xradia, Inc.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
System and Method for Fuel Cell Material X-Ray Analysis
- Publication number 20080165924
- Publication date Jul 10, 2008
- Xradia, Inc.
- Yuxin Wang
- G01 - MEASURING TESTING
Information Patent Application
Fabrication Methods for Micro Compound Optics
- Publication number 20080094694
- Publication date Apr 24, 2008
- Xradia, Inc.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
X-Ray Micro-Tomography System Optimized for High Resolution, Throug...
- Publication number 20070147583
- Publication date Jun 28, 2007
- Xradia, Inc.
- Yuxin Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Tunable x-ray fluorescence imager for multi-element analysis
- Publication number 20070108387
- Publication date May 17, 2007
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Phase Contrast Microscope for Short Wavelength Radiation and Imagin...
- Publication number 20070002215
- Publication date Jan 4, 2007
- Xradia, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Lens Bonded X-Ray Scintillator System and Manufacturing Method Ther...
- Publication number 20060192129
- Publication date Aug 31, 2006
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Low Pass X-Ray Scintillator System
- Publication number 20060163501
- Publication date Jul 27, 2006
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Back-end-of-line metallization inspection and metrology microscopy...
- Publication number 20050282300
- Publication date Dec 22, 2005
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Dual-band detector system for x-ray imaging of biological samples
- Publication number 20050226376
- Publication date Oct 13, 2005
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
ACHROMATIC FRESNEL OPTICS FOR ULTRAVIOLET AND X-RAY RADIATION
- Publication number 20050168820
- Publication date Aug 4, 2005
- XRADIA, INC.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
Element-specific X-ray fluorescence microscope and method of operation
- Publication number 20050109936
- Publication date May 26, 2005
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Short wavelength metrology imaging system
- Publication number 20040165165
- Publication date Aug 26, 2004
- Xradia, Inc.
- Wenbing Yun
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fabrication methods for micro compound optics
- Publication number 20040130785
- Publication date Jul 8, 2004
- Xradia, Inc.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
Phase contrast microscope for short wavelength radiation and imagin...
- Publication number 20040125442
- Publication date Jul 1, 2004
- Xradia, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Achromatic fresnel optics based lithography for short wavelength el...
- Publication number 20040085641
- Publication date May 6, 2004
- XRADIA, INC.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
Reflective lithography mask inspection tool based on achromatic fre...
- Publication number 20040057107
- Publication date Mar 25, 2004
- XRADIA, INC.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
Element-specific X-ray fluorescence microscope and method of operation
- Publication number 20030223536
- Publication date Dec 4, 2003
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
85423999 - VERSAXRM
- Serial number 85423999
- Registration number 4240453
- Filing date Sep 15, 2011
- Xradia, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85424021 - ULTRAXRM
- Serial number 85424021
- Registration number 4240454
- Filing date Sep 15, 2011
- Xradia, Inc.
- 10 - Surgical, medical, dental and veterinary apparatus and instruments, artificial limbs, eyes and teeth
Information Trademark
76040984 - XRADIA
- Serial number 76040984
- Registration number 2713981
- Filing date May 4, 2000
- Xradia, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Xradia, Inc.

Organization

Patents Grantslast 30 patents

Compound X-ray lens having multiple aligned zone plates

Method and system for tomographic projection correction

Alignment assembly

Verification of integrated circuits against malicious circuit inser...

Process for examining mineral samples with X-ray microscope and pro...

Metrology and registration system and method for laminography and t...

CD-GISAXS system and method

High aspect-ratio X-ray diffractive structure stabilization methods...

X-ray microscope with switchable x-ray source

Low pass X-ray scintillator system

Mechanism for switching sources in x-ray microscope

System and method for quantitative reconstruction of Zernike phase-...

X-ray micro-tomography system optimized for high resolution, throug...

Five axis compensated rotating stage

System and method for fuel cell material x-ray analysis

Structured anode X-ray source for X-ray microscopy

Phase contrast microscope for short wavelength radiation and imagin...

X-ray mammography

X-ray microscope with microfocus source and Wolter condenser

High resolution direct-projection type x-ray microtomography system...

Optimized x-ray energy for high resolution imaging of integrated ci...

X-ray micro-tomography system optimized for high resolution, throug...

Fabrication methods for micro compounds optics

Fast x-ray lenses and fabrication method therefor

Lens bonded X-ray scintillator system and manufacturing method ther...

Dual-band detector system for x-ray imaging of biological samples

Short wavelength metrology imaging system

Element-specific X-ray fluorescence microscope and method of operation

X-ray micro-tomography system optimized for high resolution, throug...

Element-specific X-ray fluorescence microscope and method of operation

Patents Applicationslast 30 patents

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

VERIFICATION OF INTEGRATED CIRCUITS AGAINST MALICIOUS CIRCUIT INSER...

Alignment Assembly

Five Axis Compensated Rotating Stage

CD-GISAXS System and Method

X-Ray Micro-Tomography System Optimized for High Resolution, Throug...

High Aspect-Ratio X-Ray Diffractive Structure Stabilization Methods...

System and Method for Fuel Cell Material X-Ray Analysis

Fabrication Methods for Micro Compound Optics

X-Ray Micro-Tomography System Optimized for High Resolution, Throug...

Tunable x-ray fluorescence imager for multi-element analysis

Phase Contrast Microscope for Short Wavelength Radiation and Imagin...

Lens Bonded X-Ray Scintillator System and Manufacturing Method Ther...

Low Pass X-Ray Scintillator System

Back-end-of-line metallization inspection and metrology microscopy...

Dual-band detector system for x-ray imaging of biological samples

ACHROMATIC FRESNEL OPTICS FOR ULTRAVIOLET AND X-RAY RADIATION

Element-specific X-ray fluorescence microscope and method of operation

Short wavelength metrology imaging system

Fabrication methods for micro compound optics

Phase contrast microscope for short wavelength radiation and imagin...

Achromatic fresnel optics based lithography for short wavelength el...

Reflective lithography mask inspection tool based on achromatic fre...

Element-specific X-ray fluorescence microscope and method of operation

Trademarklast 30 trademarks

85423999 - VERSAXRM

85424021 - ULTRAXRM

76040984 - XRADIA