XWINSYS LTD.

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Migdal Haemek, IL

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Patents Grantslast 30 patents

Information Patent Grant
Metrology measuring apparatus
- Patent number 10,697,907
- Issue date Jun 30, 2020
- XWINSYS LTD.
- Doron Reinis
- G01 - MEASURING TESTING
Information Patent Grant
Metrology inspection apparatus
- Patent number 10,697,908
- Issue date Jun 30, 2020
- XWINSYS LTD.
- Doron Reinis
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for recognizing voids in a bump
- Patent number 9,335,283
- Issue date May 10, 2016
- XWINSYS LTD.
- Micha Geffen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND A SYSTEM FOR RECOGNIZING VOIDS IN A BUMP
- Publication number 20140161224
- Publication date Jun 12, 2014
- XWINSYS LTD.
- MICHA Geffen
- G01 - MEASURING TESTING

Trademarklast 30 trademarks