Xwinsys Technology Development Ltd.

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Migdal HaEmek, IL

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Patents Grantslast 30 patents

Information Patent Grant
Dual source X-ray inspection system and method
- Patent number 12,050,187
- Issue date Jul 30, 2024
- XWINSYS Technology Developments Ltd.
- Avishai Shklar
- G01 - MEASURING TESTING
Information Patent Grant
Dual head X-ray inspection system
- Patent number 11,969,276
- Issue date Apr 30, 2024
- Xwinsys Technology Development Ltd.
- Kiyoshi Ogata
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

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