YSYSTEMS, LTD.

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Tokushima-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring surface profile
- Patent number 10,283,419
- Issue date May 7, 2019
- YSYSTEMS, LTD.
- Yves Lacroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring temperature of semiconductor layer
- Patent number 9,823,132
- Issue date Nov 21, 2017
- YSYSTEMS, LTD.
- Yves Lacroix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for measuring a luminescent decay
- Patent number 9,029,801
- Issue date May 12, 2015
- YSystems, Ltd.
- Lacroix Yves
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring temperature during deposition of se...
- Patent number 8,673,656
- Issue date Mar 18, 2014
- YSystems, Ltd.
- Lacroix Yves
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING SURFACE PROFILE
- Publication number 20170221776
- Publication date Aug 3, 2017
- YSYSTEMS, LTD.
- Yves LACROIX
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measuring Temperature of Semiconductor Layer
- Publication number 20140192839
- Publication date Jul 10, 2014
- YSYSTEMS, LTD.
- Yves Lacroix
- C30 - CRYSTAL GROWTH

Trademarklast 30 trademarks