Zeta Instruments, Inc.

Organization

San Jose, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,048,480
- Issue date Aug 14, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Method of detecting defect location using multi-surface specular re...
- Patent number 9,921,169
- Issue date Mar 20, 2018
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to optically detect defects in transparent solids
- Patent number 9,784,691
- Issue date Oct 10, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,664,888
- Issue date May 30, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,645,381
- Issue date May 9, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 9,389,408
- Issue date Jul 12, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,036,869
- Issue date May 19, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
System and method for monitoring LED chip surface roughening process
- Patent number 8,976,366
- Issue date Mar 10, 2015
- Zeta Instruments, Inc.
- James Jianguo Xu
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspector
- Patent number 8,896,825
- Issue date Nov 25, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface scattered radiation differentiation
- Patent number 8,848,181
- Issue date Sep 30, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspector with selective scattered radiation blocker
- Patent number 8,836,935
- Issue date Sep 16, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspector
- Patent number 8,830,456
- Issue date Sep 9, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical inspector
- Patent number 8,830,457
- Issue date Sep 9, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator for a 3-D optical microscope
- Patent number 8,184,364
- Issue date May 22, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3-D optical microscope
- Patent number 8,174,762
- Issue date May 8, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
3-D optical microscope
- Patent number 7,944,609
- Issue date May 17, 2011
- Zeta Instruments, Inc.
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
3-d optical microscope
- Patent number 7,729,049
- Issue date Jun 1, 2010
- Zeta Instruments, Inc.
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED 3-D MEASUREMENT
- Publication number 20180045937
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF STEP SIZE AND PLATED METAL THICKNESS
- Publication number 20180045946
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF BUMP HIEGHT
- Publication number 20180045947
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- Ronny Soetarman
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER
- Publication number 20180047148
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
DUAL MODE INSPECTOR
- Publication number 20180005364
- Publication date Jan 4, 2018
- Zeta Instruments, Inc.
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...
- Publication number 20170336330
- Publication date Nov 23, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SURFACE SPECULAR REFLECTION INSPECTOR
- Publication number 20170336331
- Publication date Nov 23, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
- Publication number 20170261440
- Publication date Sep 14, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160253813
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160252714
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
- Publication number 20160033421
- Publication date Feb 4, 2016
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226952
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226953
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION
- Publication number 20140307255
- Publication date Oct 16, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Optical Inspector
- Publication number 20140218722
- Publication date Aug 7, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Application
Optical Inspector
- Publication number 20140218724
- Publication date Aug 7, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Monitoring LED Chip Surface Roughening Process
- Publication number 20120327414
- Publication date Dec 27, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20120176475
- Publication date Jul 12, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20120051660
- Publication date Mar 1, 2012
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20120019626
- Publication date Jan 26, 2012
- Zeta Instruments, Inc.
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING

Zeta Instruments, Inc.

Organization

Patents Grantslast 30 patents

3D microscope including insertable components to provide multiple i...

Method of detecting defect location using multi-surface specular re...

Method and apparatus to optically detect defects in transparent solids

Multi-surface optical 3D microscope

Multi-surface optical 3D microscope

3D microscope and methods of measuring patterned substrates

Multi-surface optical 3D microscope

System and method for monitoring LED chip surface roughening process

Optical inspector

Multi-surface scattered radiation differentiation

Optical inspector with selective scattered radiation blocker

Optical inspector

Multi-surface optical inspector

Illuminator for a 3-D optical microscope

3-D optical microscope

3-D optical microscope

3-d optical microscope

Patents Applicationslast 30 patents

AUTOMATED 3-D MEASUREMENT

OPTICAL MEASUREMENT OF STEP SIZE AND PLATED METAL THICKNESS

OPTICAL MEASUREMENT OF BUMP HIEGHT

OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER

DUAL MODE INSPECTOR

METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...

MULTI-SURFACE SPECULAR REFLECTION INSPECTOR

METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS

3D Microscope And Methods Of Measuring Patterned Substrates

3D Microscope And Methods Of Measuring Patterned Substrates

METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS

Multi-Surface Optical 3D Microscope

Multi-Surface Optical 3D Microscope

MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION

Optical Inspector

Optical Inspector

System And Method For Monitoring LED Chip Surface Roughening Process

3D Microscope Including Insertable Components To Provide Multiple I...

Multi-Surface Optical 3D Microscope

3D Microscope And Methods Of Measuring Patterned Substrates