ZING SEMICONDUCTOR CORPORATION

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Detection method of metal impurity in wafer
- Patent number 12,107,016
- Issue date Oct 1, 2024
- ZING SEMICONDUCTOR CORPORATION
- Lanlin Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for detecting temperature of thermal chamber
- Patent number 12,046,520
- Issue date Jul 23, 2024
- ZING SEMICONDUCTOR CORPORATION
- Gongbai Cao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor crystal growth method and device
- Patent number 12,000,060
- Issue date Jun 4, 2024
- ZING SEMICONDUCTOR CORPORATION
- Weimin Shen
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for detecting temperature of thermal chamber
- Patent number 11,923,254
- Issue date Mar 5, 2024
- ZING SEMICONDUCTOR CORPORATION
- Gongbai Cao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for calculating liquid-solid interface morphology during gro...
- Patent number 11,662,326
- Issue date May 30, 2023
- ZING SEMICONDUCTOR CORPORATION
- Yan Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of monocrystal growth
- Patent number 11,624,123
- Issue date Apr 11, 2023
- ZING SEMICONDUCTOR CORPORATION
- Yan Zhao
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wafer positioning method and a semiconductor manufacturing apparatus
- Patent number 11,562,917
- Issue date Jan 24, 2023
- ZING SEMICONDUCTOR CORPORATION
- Liying Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor crystal growth apparatus
- Patent number 11,479,874
- Issue date Oct 25, 2022
- ZING SEMICONDUCTOR CORPORATION
- Weimin Shen
- C30 - CRYSTAL GROWTH
Information Patent Grant
Polishing pad, polishing apparatus and a method for polishing silic...
- Patent number 11,471,997
- Issue date Oct 18, 2022
- ZING SEMICONDUCTOR CORPORATION
- Youhe Sha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon on insulator structure and method of making the same
- Patent number 11,443,941
- Issue date Sep 13, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ingot growth
- Patent number 11,427,925
- Issue date Aug 30, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xuliang Zhao
- C30 - CRYSTAL GROWTH
Information Patent Grant
Seeding method for crystal growth
- Patent number 11,401,626
- Issue date Aug 2, 2022
- ZING SEMICONDUCTOR CORPORATION
- Weimin Shen
- C30 - CRYSTAL GROWTH
Information Patent Grant
Silicon on insulator structure and method of making the same
- Patent number 11,393,712
- Issue date Jul 19, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heat shield structure for single crystal production furnace and sin...
- Patent number 11,352,713
- Issue date Jun 7, 2022
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Grant
Complementary metal-oxide-semiconductor field-effect transistor and...
- Patent number 10,553,496
- Issue date Feb 4, 2020
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI substrate and manufacturing method thereof
- Patent number 10,170,356
- Issue date Jan 1, 2019
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for growing monocrystalline silicon and monocrystalline sili...
- Patent number 10,100,431
- Issue date Oct 16, 2018
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- C30 - CRYSTAL GROWTH
Information Patent Grant
SOI substrate and manufacturing method thereof
- Patent number 10,014,210
- Issue date Jul 3, 2018
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory...
- Patent number 9,972,637
- Issue date May 15, 2018
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary nanowire semiconductor device and fabrication method...
- Patent number 9,972,543
- Issue date May 15, 2018
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary metal-oxide-semiconductor field-effect transistor and...
- Patent number 9,875,943
- Issue date Jan 23, 2018
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making III-V nanowire quantum well transistor
- Patent number 9,837,517
- Issue date Dec 5, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for growing monocrystalline silicon and monocrystalline sili...
- Patent number 9,834,861
- Issue date Dec 5, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- C30 - CRYSTAL GROWTH
Information Patent Grant
High-voltage junctionless device with drift region and the method f...
- Patent number 9,818,844
- Issue date Nov 14, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal processing method for wafer
- Patent number 9,793,138
- Issue date Oct 17, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory...
- Patent number 9,793,285
- Issue date Oct 17, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal processing method for wafer
- Patent number 9,779,964
- Issue date Oct 3, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary nanowire semiconductor device and fabrication method...
- Patent number 9,779,999
- Issue date Oct 3, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET and fabrication method thereof
- Patent number 9,773,891
- Issue date Sep 26, 2017
- ZING SEMICONDUCTOR CORPORATION
- Deyuan Xiao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...
- Publication number 20240387241
- Publication date Nov 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...
- Publication number 20240387171
- Publication date Nov 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, APPARATUS, SYSTEM AND COMPUTER STORAGE MEDIUM OF CONTROLLIN...
- Publication number 20240218556
- Publication date Jul 4, 2024
- ZING SEMICONDUCTOR CORPORATION
- Weimin SHEN
- C30 - CRYSTAL GROWTH
Information Patent Application
CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE
- Publication number 20240218564
- Publication date Jul 4, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
EPITAXY SUSCEPTOR, EPITAXY GROWTH APPARATUS AND MANUFACTURING METHO...
- Publication number 20240191393
- Publication date Jun 13, 2024
- ZING SEMICONDUCTOR CORPORATION
- Gongbai CAO
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR DETERMINING TYPES OF DEFECTS IN MONOCRYSTALLINE SILICON...
- Publication number 20240183797
- Publication date Jun 6, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- G01 - MEASURING TESTING
Information Patent Application
SOI WAFER
- Publication number 20240096645
- Publication date Mar 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING TEMPERATURE OF THERMAL CHAMBER
- Publication number 20240071839
- Publication date Feb 29, 2024
- ZING SEMICONDUCTOR CORPORATION
- Gongbai CAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GROWING A SINGLE-CRYSTAL SILICON
- Publication number 20230323561
- Publication date Oct 12, 2023
- ZING SEMICONDUCTOR CORPORATION
- Yinfeng LI
- C30 - CRYSTAL GROWTH
Information Patent Application
STANDARD WAFERS, METHOD OF MAKING THE SAME AND CALIBRATION METHOD
- Publication number 20230326809
- Publication date Oct 12, 2023
- ZING SEMICONDUCTOR CORPORATION
- Gongbai CAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF
- Publication number 20230178366
- Publication date Jun 8, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE TREATMENT OF SOI WAFER
- Publication number 20230137599
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
PROCESS OF SURFACE TREATMENT OF SOI WAFER
- Publication number 20230133916
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE...
- Publication number 20230133092
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME
- Publication number 20230134308
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING METHOD OF RESISTIVITY OF A WAFER
- Publication number 20230040616
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER
- Publication number 20230037569
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...
- Publication number 20220333269
- Publication date Oct 20, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL
- Publication number 20220291145
- Publication date Sep 15, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CRYSTAL GROWTH METHOD AND DEVICE
- Publication number 20220213614
- Publication date Jul 7, 2022
- ZING SEMICONDUCTOR CORPORATION
- Weimin SHEN
- C30 - CRYSTAL GROWTH
Information Patent Application
DETECTION METHOD OF METAL IMPURITY IN WAFER
- Publication number 20220208617
- Publication date Jun 30, 2022
- ZING SEMICONDUCTOR CORPORATION
- Lanlin Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL GROWTH METHOD AND CRYSTAL GROWTH APPARATUS
- Publication number 20220205136
- Publication date Jun 30, 2022
- ZING SEMICONDUCTOR CORPORATION
- Weimin SHEN
- C30 - CRYSTAL GROWTH
Information Patent Application
SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20220181150
- Publication date Jun 9, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20220181200
- Publication date Jun 9, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALCULATING LIQUID-SOLID INTERFACE MORPHOLOGY DURING GRO...
- Publication number 20220163470
- Publication date May 26, 2022
- ZING SEMICONDUCTOR CORPORATION
- Yan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF MONOCRYSTAL GROWTH
- Publication number 20220136131
- Publication date May 5, 2022
- ZING SEMICONDUCTOR CORPORATION
- Yan ZHAO
- C30 - CRYSTAL GROWTH
Information Patent Application
SEEDING METHOD FOR CRYSTAL GROWTH
- Publication number 20220136132
- Publication date May 5, 2022
- ZING SEMICONDUCTOR CORPORATION
- Weimin SHEN
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR DETECTING TEMPERATURE OF THERMAL CHAMBER
- Publication number 20220115274
- Publication date Apr 14, 2022
- ZING SEMICONDUCTOR CORPORATION
- Gongbai CAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE OF CHEMICAL MECHANICAL POLISHING
- Publication number 20220097199
- Publication date Mar 31, 2022
- ZING SEMICONDUCTOR CORPORATION
- Youhe SHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR PREPARING EPITAXY WAFER AND EPITAXY WAFER THEREFROM
- Publication number 20220028732
- Publication date Jan 27, 2022
- ZING SEMICONDUCTOR CORPORATION
- Huajie Wang
- H01 - BASIC ELECTRIC ELEMENTS

ZING SEMICONDUCTOR CORPORATION

Organization

Patents Grantslast 30 patents

Detection method of metal impurity in wafer

Method for characterizing defects in silicon crystal

Method for detecting temperature of thermal chamber

Semiconductor crystal growth method and device

Method for detecting temperature of thermal chamber

Method for calculating liquid-solid interface morphology during gro...

Method and apparatus of monocrystal growth

Wafer positioning method and a semiconductor manufacturing apparatus

Semiconductor crystal growth apparatus

Polishing pad, polishing apparatus and a method for polishing silic...

Silicon on insulator structure and method of making the same

Apparatus and method for ingot growth

Seeding method for crystal growth

Silicon on insulator structure and method of making the same

Heat shield structure for single crystal production furnace and sin...

Complementary metal-oxide-semiconductor field-effect transistor and...

SOI substrate and manufacturing method thereof

Method for growing monocrystalline silicon and monocrystalline sili...

SOI substrate and manufacturing method thereof

Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory...

Complementary nanowire semiconductor device and fabrication method...

Complementary metal-oxide-semiconductor field-effect transistor and...

Method for making III-V nanowire quantum well transistor

Method for growing monocrystalline silicon and monocrystalline sili...

High-voltage junctionless device with drift region and the method f...

Thermal processing method for wafer

Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory...

Thermal processing method for wafer

Complementary nanowire semiconductor device and fabrication method...

FinFET and fabrication method thereof

Patents Applicationslast 30 patents

STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...

STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...

METHOD, APPARATUS, SYSTEM AND COMPUTER STORAGE MEDIUM OF CONTROLLIN...

CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE

EPITAXY SUSCEPTOR, EPITAXY GROWTH APPARATUS AND MANUFACTURING METHO...

METHOD FOR DETERMINING TYPES OF DEFECTS IN MONOCRYSTALLINE SILICON...

SOI WAFER

METHOD FOR DETECTING TEMPERATURE OF THERMAL CHAMBER

METHOD OF GROWING A SINGLE-CRYSTAL SILICON

STANDARD WAFERS, METHOD OF MAKING THE SAME AND CALIBRATION METHOD

SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF

SURFACE TREATMENT OF SOI WAFER

PROCESS OF SURFACE TREATMENT OF SOI WAFER

SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE...

SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME

MEASURING METHOD OF RESISTIVITY OF A WAFER

METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER

METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...

METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL

SEMICONDUCTOR CRYSTAL GROWTH METHOD AND DEVICE

DETECTION METHOD OF METAL IMPURITY IN WAFER

CRYSTAL GROWTH METHOD AND CRYSTAL GROWTH APPARATUS

SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME

SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME

METHOD FOR CALCULATING LIQUID-SOLID INTERFACE MORPHOLOGY DURING GRO...

METHOD AND APPARATUS OF MONOCRYSTAL GROWTH

SEEDING METHOD FOR CRYSTAL GROWTH

METHOD FOR DETECTING TEMPERATURE OF THERMAL CHAMBER

METHOD AND DEVICE OF CHEMICAL MECHANICAL POLISHING

PROCESS FOR PREPARING EPITAXY WAFER AND EPITAXY WAFER THEREFROM

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