A. Nicholas Sporck

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
AC coupled parameteric test probe
- Patent number 7,952,375
- Issue date May 31, 2011
- FormFactor, Inc.
- Benjamin N Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Sharing resources in a system for testing semiconductor devices
- Patent number 7,852,094
- Issue date Dec 14, 2010
- FormFactor, Inc.
- Matthew E. Chraft
- G01 - MEASURING TESTING
Information Patent Grant
Test system with wireless communications
- Patent number 7,821,255
- Issue date Oct 26, 2010
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Wireless test system
- Patent number 7,675,311
- Issue date Mar 9, 2010
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Mechanically reconfigurable vertical tester interface for IC probing
- Patent number 7,659,736
- Issue date Feb 9, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for switching tester resources
- Patent number 7,649,366
- Issue date Jan 19, 2010
- FormFactor, Inc.
- Roy J. Henson
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and kit
- Patent number 7,616,016
- Issue date Nov 10, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for managing thermally induced motion of a pro...
- Patent number 7,592,821
- Issue date Sep 22, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit assembly
- Patent number 7,550,842
- Issue date Jun 23, 2009
- FormFactor, Inc.
- Igor Y. Khandros
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing an electronic device using test data from a plurality of te...
- Patent number 7,548,055
- Issue date Jun 16, 2009
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and kit
- Patent number 7,352,196
- Issue date Apr 1, 2008
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for managing thermally induced motion of a pro...
- Patent number 7,285,968
- Issue date Oct 23, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Mechanically reconfigurable vertical tester interface for IC probing
- Patent number 7,230,437
- Issue date Jun 12, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Wireless test system
- Patent number 7,218,094
- Issue date May 15, 2007
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wireless semiconductor device testing
- Patent number 7,202,687
- Issue date Apr 10, 2007
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and kit
- Patent number 7,064,566
- Issue date Jun 20, 2006
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card assembly
- Patent number 7,061,257
- Issue date Jun 13, 2006
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card with coplanar daughter card
- Patent number 6,856,150
- Issue date Feb 15, 2005
- FormFactor, Inc.
- A. Nicholas Sporck
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for testing the operation of a semiconductor device
- Patent number 5,867,033
- Issue date Feb 2, 1999
- LSI Logic Corporation
- A. Nicholas Sporck
- G01 - MEASURING TESTING
Information Patent Grant
Stroboscopic photometer
- Patent number 5,646,406
- Issue date Jul 8, 1997
- LSI Logic Corporation
- A. Nicholas Sporck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED...
- Publication number 20110267085
- Publication date Nov 3, 2011
- FormFactor, Inc.
- Tommie Edward Berry
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...
- Publication number 20100000080
- Publication date Jan 7, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Wireless Test Cassette
- Publication number 20090251162
- Publication date Oct 8, 2009
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Testing Devices Using Serially Controlled...
- Publication number 20090085590
- Publication date Apr 2, 2009
- FormFactor, Inc.
- Tommie Edward Berry
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY AND KIT
- Publication number 20080180121
- Publication date Jul 31, 2008
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080136432
- Publication date Jun 12, 2008
- FormFactor, Inc.
- Matthew E. Chraft
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARTUS FOR SWITCHING TESTER RESOURCES
- Publication number 20080054917
- Publication date Mar 6, 2008
- FormFactor, Inc.
- Roy J. Henson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...
- Publication number 20080042668
- Publication date Feb 21, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
AC coupled parameteric test probe
- Publication number 20070296435
- Publication date Dec 27, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING
- Publication number 20070229102
- Publication date Oct 4, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS TEST SYSTEM
- Publication number 20070210822
- Publication date Sep 13, 2007
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Wireless Test Cassette
- Publication number 20070182438
- Publication date Aug 9, 2007
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Probe Card Assembly And Kit
- Publication number 20060279300
- Publication date Dec 14, 2006
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus And Method For Managing Thermally Induced Motion Of A Pro...
- Publication number 20060255814
- Publication date Nov 16, 2006
- FORMFACTOR
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Mechanically reconfigurable vertical tester interface for IC probing
- Publication number 20050277323
- Publication date Dec 15, 2005
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Wireless test cassette
- Publication number 20050225347
- Publication date Oct 13, 2005
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Probe card with coplanar daughter card
- Publication number 20050140381
- Publication date Jun 30, 2005
- FormFactor, Inc.
- A. Nicholas Sporck
- G01 - MEASURING TESTING
Information Patent Application
Wireless test system
- Publication number 20050086021
- Publication date Apr 21, 2005
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly
- Publication number 20050035347
- Publication date Feb 17, 2005
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Integrated circuit assembly
- Publication number 20040113250
- Publication date Jun 17, 2004
- Igor Y. Khandros
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe card assembly
- Publication number 20030222667
- Publication date Dec 4, 2003
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probe card with coplanar daughter card
- Publication number 20020145437
- Publication date Oct 10, 2002
- FormFactor, Inc.
- A. Nicholas Sporck
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY AND KIT
- Publication number 20010054905
- Publication date Dec 27, 2001
- IGOR Y. KHANDROS
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

A. Nicholas Sporck

Person

Patents Grantslast 30 patents

AC coupled parameteric test probe

Sharing resources in a system for testing semiconductor devices

Test system with wireless communications

Wireless test system

Mechanically reconfigurable vertical tester interface for IC probing

Method and apparatus for switching tester resources

Probe card assembly and kit

Apparatus and method for managing thermally induced motion of a pro...

Integrated circuit assembly

Testing an electronic device using test data from a plurality of te...

Probe card assembly and kit

Apparatus and method for managing thermally induced motion of a pro...

Mechanically reconfigurable vertical tester interface for IC probing

Wireless test system

Systems and methods for wireless semiconductor device testing

Probe card assembly and kit

Probe card assembly

Probe card with coplanar daughter card

Circuit for testing the operation of a semiconductor device

Stroboscopic photometer

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED...

APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...

Wireless Test Cassette

Method And Apparatus For Testing Devices Using Serially Controlled...

PROBE CARD ASSEMBLY AND KIT

SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES

METHOD AND APPARTUS FOR SWITCHING TESTER RESOURCES

APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...

AC coupled parameteric test probe

MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING

WIRELESS TEST SYSTEM

Wireless Test Cassette

Probe Card Assembly And Kit

Apparatus And Method For Managing Thermally Induced Motion Of A Pro...

Mechanically reconfigurable vertical tester interface for IC probing

Wireless test cassette

Probe card with coplanar daughter card

Wireless test system

Probe card assembly

Integrated circuit assembly

Probe card assembly

Probe card with coplanar daughter card

PROBE CARD ASSEMBLY AND KIT