A-ron BAIK

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device and method for assisting in vehicle driving
- Patent number 11,217,100
- Issue date Jan 4, 2022
- Samsung Electronics Co., Ltd.
- Jin-woo Yoo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Electronic device for generating map data and operating method ther...
- Patent number 11,183,056
- Issue date Nov 23, 2021
- Samsung Electronics Co., Ltd.
- Mid-eum Choi
- G08 - SIGNALLING
Information Patent Grant
Distance sensor, and calibration method performed by device and sys...
- Patent number 11,099,262
- Issue date Aug 24, 2021
- Samsung Electronics Co., Ltd.
- A-ron Baik
- G01 - MEASURING TESTING
Information Patent Grant
Distance sensor, and calibration method performed by device and sys...
- Patent number 10,539,664
- Issue date Jan 21, 2020
- Samsung Electronics Co., Ltd.
- A-ron Baik
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE FOR GENERATING MAP DATA AND OPERATING METHOD THER...
- Publication number 20210142667
- Publication date May 13, 2021
- Samsung Electronics Co., LTD
- Mid-eum CHOI
- G08 - SIGNALLING
Information Patent Application
DISTANCE SENSOR, AND CALIBRATION METHOD PERFORMED BY DEVICE AND SYS...
- Publication number 20200116841
- Publication date Apr 16, 2020
- Samsung Electronics Co., Ltd.
- A-ron BAIK
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR ASSISTING IN VEHICLE DRIVING
- Publication number 20200027352
- Publication date Jan 23, 2020
- SAMSUNG ELECTRONICS CO., LTD.
- Jin-woo YOO
- B60 - VEHICLES IN GENERAL
Information Patent Application
DEVICE AND METHOD FOR ASSISTING DRIVING OF VEHICLES
- Publication number 20200011693
- Publication date Jan 9, 2020
- Samsung Electronics Co., Ltd.
- Jin-woo YOO
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE SENSOR, AND CALIBRATION METHOD PERFORMED BY DEVICE AND SYS...
- Publication number 20170328992
- Publication date Nov 16, 2017
- Samsung Electronics Co., Ltd.
- A-ron BAIK
- G01 - MEASURING TESTING