Aage BENDIKSEN

Person

Fairfield, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pellicle and pellicle assembly
- Patent number 12,066,758
- Issue date Aug 20, 2024
- ASML Netherlands B.V.
- David Ferdinand Vles
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for determining a condition associated with a...
- Patent number 11,906,907
- Issue date Feb 20, 2024
- ASML Netherlands B.V.
- Derk Servatius Gertruda Brouns
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Contaminant detection metrology system, lithographic apparatus, and...
- Patent number 11,803,119
- Issue date Oct 31, 2023
- ASML Holding N.V.
- Michal Emanuel Pawlowski
- G01 - MEASURING TESTING
Information Patent Grant
Control of reticle placement for defectivity optimization
- Patent number 11,422,478
- Issue date Aug 23, 2022
- ASML Holding N.V.
- Andrew Judge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pellicle and pellicle assembly
- Patent number 11,347,142
- Issue date May 31, 2022
- ASML Netherlands B.V.
- David Ferdinand Vles
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pellicle and pellicle assembly
- Patent number 10,983,431
- Issue date Apr 20, 2021
- ASML Netherlands B.V.
- David Ferdinand Vles
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pellicle and pellicle assembly
- Patent number 10,466,585
- Issue date Nov 5, 2019
- ASML Netherlands B.V.
- David Ferdinand Vles
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...
- Publication number 20240103386
- Publication date Mar 28, 2024
- ASML NETHERLANDS B.V.
- Derk Servatius Gertruda BROUNS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTAMINANT ANALYZING METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND...
- Publication number 20230137537
- Publication date May 4, 2023
- ASML Holding N.V.
- Michal Emanuel PAWLOWSKI
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINANT DETECTION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND...
- Publication number 20230106481
- Publication date Apr 6, 2023
- ASML Holding N.V.
- Michal Emanuel PAWLOWSKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR REGION OF INTEREST PROCESSING FOR RETICLE PARTICLE DETEC...
- Publication number 20230055116
- Publication date Feb 23, 2023
- ASML Holding N.V.
- Peter Conrad KOCHERSPERGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PELLICLE AND PELLICLE ASSEMBLY
- Publication number 20220252974
- Publication date Aug 11, 2022
- ASML NETHERLANDS B.V.
- David Ferdinand VLES
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PELLICLE AND PELLICLE ASSEMBLY
- Publication number 20210208500
- Publication date Jul 8, 2021
- ASML NETHERLANDS B.V.
- David Ferdinand VLES
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-IMAGE PARTICLE DETECTION SYSTEM AND METHOD
- Publication number 20200386692
- Publication date Dec 10, 2020
- ASML Holding N.V.
- Aage BENDIKSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...
- Publication number 20200341366
- Publication date Oct 29, 2020
- ASML NETHERLANDS B.V.
- Derk Servatius Gertruda BROUNS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTROL OF RETICLE PLACEMENT FOR DEFECTIVITY OPTIMIZATION
- Publication number 20200166855
- Publication date May 28, 2020
- ASML Holding N.V.
- Andrew JUDGE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PELLICLE AND PELLICLE ASSEMBLY
- Publication number 20200064731
- Publication date Feb 27, 2020
- ASML NETHERLANDS B.V.
- David Ferdinand VLES
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PELLICLE AND PELLICLE ASSEMBLY
- Publication number 20180364561
- Publication date Dec 20, 2018
- ASML NETHERLANDS B.V.
- David Ferdinand VLES
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Aage BENDIKSEN

Person

Patents Grantslast 30 patents

Pellicle and pellicle assembly

Apparatus and method for determining a condition associated with a...

Contaminant detection metrology system, lithographic apparatus, and...

Control of reticle placement for defectivity optimization

Pellicle and pellicle assembly

Pellicle and pellicle assembly

Pellicle and pellicle assembly

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...

CONTAMINANT ANALYZING METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND...

CONTAMINANT DETECTION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND...

METHOD FOR REGION OF INTEREST PROCESSING FOR RETICLE PARTICLE DETEC...

PELLICLE AND PELLICLE ASSEMBLY

PELLICLE AND PELLICLE ASSEMBLY

MULTI-IMAGE PARTICLE DETECTION SYSTEM AND METHOD

APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...

CONTROL OF RETICLE PLACEMENT FOR DEFECTIVITY OPTIMIZATION

PELLICLE AND PELLICLE ASSEMBLY

PELLICLE AND PELLICLE ASSEMBLY