Aaron Durbin

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 10,571,489
- Issue date Feb 25, 2020
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 9,612,259
- Issue date Apr 4, 2017
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 9,176,186
- Issue date Nov 3, 2015
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 9,146,269
- Issue date Sep 29, 2015
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 8,872,533
- Issue date Oct 28, 2014
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing systems and associated methods of use and manufacture
- Patent number 8,405,414
- Issue date Mar 26, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 8,362,797
- Issue date Jan 29, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20170219629
- Publication date Aug 3, 2017
- TRANSLARITY, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20150015292
- Publication date Jan 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...
- Publication number 20140197858
- Publication date Jul 17, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20130314115
- Publication date Nov 28, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...
- Publication number 20130187675
- Publication date Jul 25, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEMS AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20120074976
- Publication date Mar 29, 2012
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
Maintaining A Wafer/Wafer Translator Pair In An Attached State Free...
- Publication number 20110050274
- Publication date Mar 3, 2011
- Aaron Durbin
- G01 - MEASURING TESTING

Aaron Durbin

Person

Patents Grantslast 30 patents

Wafer testing system and associated methods of use and manufacture

Wafer testing system and associated methods of use and manufacture

Maintaining a wafer/wafer translator pair in an attached state free...

Maintaining a wafer/wafer translator pair in an attached state free...

Wafer testing system and associated methods of use and manufacture

Wafer testing systems and associated methods of use and manufacture

Maintaining a wafer/wafer translator pair in an attached state free...

Patents Applicationslast 30 patents

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...

WAFER TESTING SYSTEMS AND ASSOCIATED METHODS OF USE AND MANUFACTURE

Maintaining A Wafer/Wafer Translator Pair In An Attached State Free...