Aaron Wang

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for wafer-level testing of integrated circuits
- Patent number 8,237,462
- Issue date Aug 7, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Yang Hung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Wafer-Level Testing of Integrated Circuits
- Publication number 20110037494
- Publication date Feb 17, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Yang Hung
- G01 - MEASURING TESTING