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Aaron Yevick
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New York, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Colloidal fingerprints for soft materials using total holographic c...
Patent number
11,977,015
Issue date
May 7, 2024
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Colloidal fingerprints for soft materials using total holographic c...
Patent number
11,085,864
Issue date
Aug 10, 2021
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fast feature identification for holographic tracking and characteri...
Patent number
10,983,041
Issue date
Apr 20, 2021
New York University
Aaron Yevick
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Colloidal fingerprints for soft materials using total holographic c...
Patent number
10,656,065
Issue date
May 19, 2020
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Machine-learning approach to holographic particle characterization
Patent number
10,222,315
Issue date
Mar 5, 2019
New York University
David G. Grier
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
COLLOIDAL FINGERPRINTS FOR SOFT MATERIALS USING TOTAL HOLOGRAPHIC C...
Publication number
20210364403
Publication date
Nov 25, 2021
NEW YORK UNIVERSITY
David G. GRIER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COLLOIDAL FINGERPRINTS FOR SOFT MATERIALS USING TOTAL HOLOGRAPHIC C...
Publication number
20170307497
Publication date
Oct 26, 2017
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
MACHINE-LEARNING APPROACH TO HOLOGRAPHIC PARTICLE CHARACTERIZATION
Publication number
20170241891
Publication date
Aug 24, 2017
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
FAST FEATURE IDENTIFICATION FOR HOLOGRAPHIC TRACKING AND CHARACTERI...
Publication number
20170059468
Publication date
Mar 2, 2017
NEW YORK UNIVERSITY
Aaron Yevick
G01 - MEASURING TESTING