Abdullah M. Yassine

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Wide area soft defect localization
- Patent number 8,558,565
- Issue date Oct 15, 2013
- Advanced Micro Devices, Inc.
- Abdullah M. Yassine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for nano probing a semiconductor chip
- Patent number 7,847,575
- Issue date Dec 7, 2010
- GLOBALFOUNDRIES Inc.
- Ronald M. Potok
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device short analysis
- Patent number 6,465,266
- Issue date Oct 15, 2002
- Advanced Micro Devices, Inc.
- Abdullah Mohamad Yassine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WIDE AREA SOFT DEFECT LOCALIZATION
- Publication number 20120206158
- Publication date Aug 16, 2012
- Abdullah M. Yassine
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Nano Probing a Semiconductor Chip
- Publication number 20100019786
- Publication date Jan 28, 2010
- Ronald M. Potok
- G01 - MEASURING TESTING