Abel Valdes

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Miami, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact microelectronic device inspection systems and methods
- Patent number 8,661,905
- Issue date Mar 4, 2014
- Georgia Tech Research Corporation
- Ifeanyi Charles Ume
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Non-Contact Microelectronic Device Inspection Systems And Methods
- Publication number 20120111115
- Publication date May 10, 2012
- Georgia Tech Research Corporation
- Ifeanyi Charles Ume
- G01 - MEASURING TESTING