Abhishek Mahajan

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Noida, IN

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Patents Grantslast 30 patents

Information Patent Grant
System and method for testing clocking systems in integrated circuits
- Patent number 11,879,939
- Issue date Jan 23, 2024
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock control system for scan chains
- Patent number 11,604,223
- Issue date Mar 14, 2023
- NXP USA, INC.
- Himanshu Mangal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Design For Test For Source Synchronous Interfaces
- Publication number 20240192271
- Publication date Jun 13, 2024
- NXP B.V.
- Akhil Garg
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING CLOCKING SYSTEMS IN INTEGRATED CIRCUITS
- Publication number 20230251310
- Publication date Aug 10, 2023
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING