Abhishek Sharma

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Scan flip-flop circuit with dedicated clocks
- Patent number 9,606,177
- Issue date Mar 28, 2017
- Advanced Micro Devices, Inc.
- Daniel W. Bailey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN FLIP-FLOP CIRCUIT WITH DEDICATED CLOCKS
- Publication number 20160341793
- Publication date Nov 24, 2016
- Advanced Micro Devices, Inc.
- Daniel W. Bailey
- G01 - MEASURING TESTING