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Abidin Guclu Onaran
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Atlanta, GA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated displacement sensors for probe microscopy and force spec...
Patent number
7,637,149
Issue date
Dec 29, 2009
Georgia Tech Research Corporation
F. Levent Degertekin
G01 - MEASURING TESTING
Information
Patent Grant
Methods of imaging in probe microscopy
Patent number
7,441,447
Issue date
Oct 28, 2008
Georgia Tech Research Corporation
Fahrettin L. Degertekin
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the ultrasonic actuation of the cantilever...
Patent number
6,694,817
Issue date
Feb 24, 2004
Georgia Tech Research Corporation
F. Levent Degertekin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS OF IMAGING IN PROBE MICROSCOPY
Publication number
20070295064
Publication date
Dec 27, 2007
Fahrettin L. Degertekin
G01 - MEASURING TESTING
Information
Patent Application
Integrated displacement sensors for probe microscopy and force spec...
Publication number
20070012094
Publication date
Jan 18, 2007
F. Levent Degertekin
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for the ultrasonic actuation of the cantilever...
Publication number
20030041669
Publication date
Mar 6, 2003
F. Levent Degertekin
B82 - NANO-TECHNOLOGY