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Abigaël Adriana Maria Kok
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Eindhoven, NL
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last 30 patents
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Patent Grant
Method of calibrating a scanning transmission charged-particle micr...
Patent number
9,396,907
Issue date
Jul 19, 2016
FEI Company
Maximus Theodorus Otten
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
METHOD OF CALIBRATING A SCANNING TRANSMISSION CHARGED-PARTICLE MICR...
Publication number
20160013016
Publication date
Jan 14, 2016
FEI Company
Maximus Theodorus Otten
H01 - BASIC ELECTRIC ELEMENTS