Abner F. Bello

Person

Clifton Park, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Rechargeable wafer carrier systems
- Patent number 10,931,143
- Issue date Feb 23, 2021
- GLOBALFOUNDRIES U.S. INC.
- Abner Bello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-contained metrology wafer carrier systems
- Patent number 10,818,528
- Issue date Oct 27, 2020
- GLOBALFOUNDRIES Inc.
- Abner Bello
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and systems for chemical mechanical planarization endpoint...
- Patent number 10,343,253
- Issue date Jul 9, 2019
- GLOBALFOUNDRIES, INC.
- Abner Bello
- B24 - GRINDING POLISHING
Information Patent Grant
Self-contained metrology wafer carrier systems
- Patent number 10,242,895
- Issue date Mar 26, 2019
- GLOBALFOUNDRIES Inc.
- Abner Bello
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-contained metrology wafer carrier systems
- Patent number 9,911,634
- Issue date Mar 6, 2018
- GLOBALFOUNDRIES Inc.
- Abner Bello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress memorization film and oxide isolation in fins
- Patent number 9,419,137
- Issue date Aug 16, 2016
- GLOBALFOUNDRIES Inc.
- Abner Bello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming substantially self-aligned isolation regions on...
- Patent number 9,318,388
- Issue date Apr 19, 2016
- GLOBALFOUNDRIES Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling measurement of layer thicknesses of a plurality of layer...
- Patent number 9,281,249
- Issue date Mar 8, 2016
- GLOBALFOUNDRIES Inc.
- Alok Vaid
- G01 - MEASURING TESTING
Information Patent Grant
Methods of forming stressed fin channel structures for FinFET semic...
- Patent number 9,117,930
- Issue date Aug 25, 2015
- GLOBALFOUNDRIES Inc.
- Vimal K. Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming substantially self-aligned isolation regions on...
- Patent number 9,093,302
- Issue date Jul 28, 2015
- GLOBALFOUNDRIES Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and method to facilitate development/optimization of...
- Patent number 8,975,094
- Issue date Mar 10, 2015
- GLOBALFOUNDRIES Inc.
- Abner F. Bello
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
FinFET channel stress using tungsten contacts in raised epitaxial s...
- Patent number 8,975,142
- Issue date Mar 10, 2015
- GLOBALFOUNDRIES Inc.
- Abhijeet Paul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming stressed fin channel structures for FinFET semic...
- Patent number 8,889,500
- Issue date Nov 18, 2014
- GLOBALFOUNDRIES Inc.
- Vimal K. Kamineni
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS
- Publication number 20190148180
- Publication date May 16, 2019
- GLOBALFOUNDRIES INC.
- Abner BELLO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS
- Publication number 20180143077
- Publication date May 24, 2018
- GLOBALFOUNDRIES INC.
- Abner BELLO
- G01 - MEASURING TESTING
Information Patent Application
RECHARGEABLE WAFER CARRIER SYSTEMS
- Publication number 20180048169
- Publication date Feb 15, 2018
- GLOBALFOUNDRIES INC.
- Abner BELLO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS
- Publication number 20170372924
- Publication date Dec 28, 2017
- GLOBALFOUNDRIES INC.
- Abner BELLO
- G01 - MEASURING TESTING
Information Patent Application
FINFET DEVICE WITH A SUBSTANTIALLY SELF-ALIGNED ISOLATION REGION PO...
- Publication number 20160190306
- Publication date Jun 30, 2016
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR CHEMICAL MECHANICAL PLANARIZATION ENDPOINT...
- Publication number 20150371912
- Publication date Dec 24, 2015
- GLOBALFOUNDRIES, Inc.
- Abner Bello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING SUBSTANTIALLY SELF-ALIGNED ISOLATION REGIONS ON...
- Publication number 20150294912
- Publication date Oct 15, 2015
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DECOUPLING MEASUREMENT OF LAYER THICKNESSES OF A PLURALITY OF LAYER...
- Publication number 20150198435
- Publication date Jul 16, 2015
- GLOBALFOUNDRIES INC.
- Alok VAID
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF FORMING SUBSTANTIALLY SELF-ALIGNED ISOLATION REGIONS ON...
- Publication number 20150129934
- Publication date May 14, 2015
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING STRESSED FIN CHANNEL STRUCTURES FOR FINFET SEMIC...
- Publication number 20150041906
- Publication date Feb 12, 2015
- GLOBALFOUNDRIES INC.
- Vimal K. Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET CHANNEL STRESS USING TUNGSTEN CONTACTS IN RAISED EPITAXIAL S...
- Publication number 20140319614
- Publication date Oct 30, 2014
- GLOBALFOUNDRIES, Inc.
- Abhijeet PAUL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND METHOD TO FACILTIATE DEVELOPMENT/OPTIMIZATION OF...
- Publication number 20140203279
- Publication date Jul 24, 2014
- GLOBALFOUNDRIES, Inc.
- Abner F. Bello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FABRICATING INTEGRATED CIRCUITS WITH STRESSED SEMICONDU...
- Publication number 20140017903
- Publication date Jan 16, 2014
- GLOBALFOUNDRIES INC.
- Abner Bello
- H01 - BASIC ELECTRIC ELEMENTS

Abner F. Bello

Person

Patents Grantslast 30 patents

Rechargeable wafer carrier systems

Self-contained metrology wafer carrier systems

Methods and systems for chemical mechanical planarization endpoint...

Self-contained metrology wafer carrier systems

Self-contained metrology wafer carrier systems

Stress memorization film and oxide isolation in fins

Methods of forming substantially self-aligned isolation regions on...

Decoupling measurement of layer thicknesses of a plurality of layer...

Methods of forming stressed fin channel structures for FinFET semic...

Methods of forming substantially self-aligned isolation regions on...

Test structure and method to facilitate development/optimization of...

FinFET channel stress using tungsten contacts in raised epitaxial s...

Methods of forming stressed fin channel structures for FinFET semic...

Patents Applicationslast 30 patents

SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS

SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS

RECHARGEABLE WAFER CARRIER SYSTEMS

SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS

FINFET DEVICE WITH A SUBSTANTIALLY SELF-ALIGNED ISOLATION REGION PO...

METHODS AND SYSTEMS FOR CHEMICAL MECHANICAL PLANARIZATION ENDPOINT...

METHODS OF FORMING SUBSTANTIALLY SELF-ALIGNED ISOLATION REGIONS ON...

DECOUPLING MEASUREMENT OF LAYER THICKNESSES OF A PLURALITY OF LAYER...

METHODS OF FORMING SUBSTANTIALLY SELF-ALIGNED ISOLATION REGIONS ON...

METHODS OF FORMING STRESSED FIN CHANNEL STRUCTURES FOR FINFET SEMIC...

FINFET CHANNEL STRESS USING TUNGSTEN CONTACTS IN RAISED EPITAXIAL S...

TEST STRUCTURE AND METHOD TO FACILTIATE DEVELOPMENT/OPTIMIZATION OF...

METHODS FOR FABRICATING INTEGRATED CIRCUITS WITH STRESSED SEMICONDU...