Abraham Ravid

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Position and temperature monitoring of ALD platen susceptor
- Patent number 11,430,680
- Issue date Aug 30, 2022
- Applied Materials, Inc.
- Abraham Ravid
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Particle detection for substrate processing
- Patent number 11,119,051
- Issue date Sep 14, 2021
- Applied Materials, Inc.
- Todd Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection for substrate processing
- Patent number 10,845,317
- Issue date Nov 24, 2020
- Applied Materials, Inc.
- Todd Egan
- G01 - MEASURING TESTING
Information Patent Grant
Position and temperature monitoring of ALD platen susceptor
- Patent number 10,312,120
- Issue date Jun 4, 2019
- Applied Materials, Inc.
- Abraham Ravid
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electroplating tool with feedback of metal thickness distribution a...
- Patent number 10,260,855
- Issue date Apr 16, 2019
- Applied Materials, Inc.
- Todd J. Egan
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Wafer placement and gap control optimization through in situ feedback
- Patent number 10,196,741
- Issue date Feb 5, 2019
- Applied Materials, Inc.
- Kevin Griffin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods and apparatus to determine parameters in metal-containing f...
- Patent number 9,880,233
- Issue date Jan 30, 2018
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact sheet resistance measurement of barrier and/or seed lay...
- Patent number 9,631,919
- Issue date Apr 25, 2017
- Applied Materials, Inc.
- Abraham Ravid
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method of aligning substrate-scale mask with substrate
- Patent number 9,490,154
- Issue date Nov 8, 2016
- Applied Materials, Inc.
- Abraham Ravid
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for optical calibration of wafer placement by...
- Patent number 9,405,287
- Issue date Aug 2, 2016
- Applied Materials, Inc.
- Abraham Ravid
- G05 - CONTROLLING REGULATING
Information Patent Grant
Metrology system for imaging workpiece surfaces at high robot trans...
- Patent number 8,698,889
- Issue date Apr 15, 2014
- Applied Materials, Inc.
- Abraham Ravid
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Metrology for GST film thickness and phase
- Patent number 8,639,377
- Issue date Jan 28, 2014
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Grant
Method for imaging workpiece surfaces at high robot transfer speeds...
- Patent number 8,620,064
- Issue date Dec 31, 2013
- Applied Materials, Inc.
- Abraham Ravid
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for imaging workpiece surfaces at high robot transfer speeds...
- Patent number 8,452,077
- Issue date May 28, 2013
- Applied Materials, Inc.
- Abraham Ravid
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for measuring substrate edge thickness during...
- Patent number 8,125,654
- Issue date Feb 28, 2012
- Applied Materials, Inc.
- Dominic J. Benvegnu
- B24 - GRINDING POLISHING
Information Patent Grant
Determining physical property of substrate
- Patent number 8,014,004
- Issue date Sep 6, 2011
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Grant
High throughput measurement system
- Patent number 7,952,708
- Issue date May 31, 2011
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for generating a library of spectra
- Patent number 7,840,375
- Issue date Nov 23, 2010
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Grant
Determining physical property of substrate
- Patent number 7,746,485
- Issue date Jun 29, 2010
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Grant
Determining physical property of substrate
- Patent number 7,444,198
- Issue date Oct 28, 2008
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE DETECTION FOR SUBSTRATE PROCESSING
- Publication number 20210018449
- Publication date Jan 21, 2021
- Applied Materials, Inc.
- Todd EGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Position And Temperature Monitoring Of ALD Platen Susceptor
- Publication number 20190244842
- Publication date Aug 8, 2019
- Applied Materials, Inc.
- Abraham Ravid
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PARTICLE DETECTION FOR SUBSTRATE PROCESSING
- Publication number 20190072497
- Publication date Mar 7, 2019
- Applied Materials, Inc.
- Todd EGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-Contact Sheet Resistance Measurement of Barrier and/or Seed Lay...
- Publication number 20170226655
- Publication date Aug 10, 2017
- Applied Materials, Inc.
- Abraham Ravid
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
COLOR IMAGING FOR CMP MONITORING
- Publication number 20170140525
- Publication date May 18, 2017
- Dominic J. Benvegnu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE-SCALE MASK ALIGNMENT
- Publication number 20160211185
- Publication date Jul 21, 2016
- Applied Materials, Inc.
- Abraham Ravid
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Position And Temperature Monitoring Of ALD Platen Susceptor
- Publication number 20160027675
- Publication date Jan 28, 2016
- Abraham Ravid
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Wafer Placement And Gap Control Optimization Through In Situ Feedback
- Publication number 20150376782
- Publication date Dec 31, 2015
- Kevin Griffin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
NON-CONTACT SHEET RESISTANCE MEASUREMENT OF BARRIER AND/OR SEED LAY...
- Publication number 20140367265
- Publication date Dec 18, 2014
- Applied Materials, Inc.
- Abraham Ravid
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
ELECTROPLATING TOOL WITH FEEDBACK OF METAL THICKNESS DISTRIBUTION A...
- Publication number 20140367267
- Publication date Dec 18, 2014
- Applied Materials, Inc.
- Todd J. Egan
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
METHODS AND APPARATUS TO DETERMINE PARAMETERS IN METAL-CONTAINING F...
- Publication number 20120274318
- Publication date Nov 1, 2012
- Applied Materials, Inc.
- ABRAHAM RAVID
- G01 - MEASURING TESTING
Information Patent Application
Determining Physical Property of Substrate
- Publication number 20110294400
- Publication date Dec 1, 2011
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM FOR IMAGING WORKPIECE SURFACES AT HIGH ROBOT TRANS...
- Publication number 20110199476
- Publication date Aug 18, 2011
- Applied Materials, Inc.
- Abraham Ravid
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR IMAGING WORKPIECE SURFACES AT HIGH ROBOT TRANSFER SPEEDS...
- Publication number 20110200247
- Publication date Aug 18, 2011
- Applied Materials, Inc.
- Abraham Ravid
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IMAGING WORKPIECE SURFACES AT HIGH ROBOT TRANSFER SPEEDS...
- Publication number 20110199477
- Publication date Aug 18, 2011
- Applied Materials, Inc.
- Abraham Ravid
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR GENERATING A LIBRARY OF SPECTRA
- Publication number 20110046918
- Publication date Feb 24, 2011
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
Determining Physical Property of Substrate
- Publication number 20100261413
- Publication date Oct 14, 2010
- Applied Materials, Inc.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY FOR GST FILM THICKNESS AND PHASE
- Publication number 20100116990
- Publication date May 13, 2010
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Application
METHODS AND APPARATUS FOR MEASURING SUBSTRATE EDGE THICKNESS DURING...
- Publication number 20090262353
- Publication date Oct 22, 2009
- Applied Materials, Inc.
- Dominic J. Benvegnu
- B24 - GRINDING POLISHING
Information Patent Application
Determining Physical Property of Substrate
- Publication number 20090033942
- Publication date Feb 5, 2009
- APPLIED MATERIALS, INC.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT MEASUREMENT SYSTEM
- Publication number 20080239308
- Publication date Oct 2, 2008
- APPLIED MATERIALS, INC.
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR GENERATING A LIBRARY OF SPECTRA
- Publication number 20080243433
- Publication date Oct 2, 2008
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING PHYSICAL PROPERTY OF SUBSTRATE
- Publication number 20080146120
- Publication date Jun 19, 2008
- Abraham Ravid
- G01 - MEASURING TESTING
Information Patent Application
Continuous in-line monitoring and qualification of polishing rates
- Publication number 20070123046
- Publication date May 31, 2007
- APPLIED MATERIALS, INC.
- Abraham Ravid
- B24 - GRINDING POLISHING

Abraham Ravid

Person

Patents Grantslast 30 patents

Position and temperature monitoring of ALD platen susceptor

Particle detection for substrate processing

Particle detection for substrate processing

Position and temperature monitoring of ALD platen susceptor

Electroplating tool with feedback of metal thickness distribution a...

Wafer placement and gap control optimization through in situ feedback

Methods and apparatus to determine parameters in metal-containing f...

Non-contact sheet resistance measurement of barrier and/or seed lay...

Method of aligning substrate-scale mask with substrate

Apparatus and method for optical calibration of wafer placement by...

Metrology system for imaging workpiece surfaces at high robot trans...

Metrology for GST film thickness and phase

Method for imaging workpiece surfaces at high robot transfer speeds...

Method for imaging workpiece surfaces at high robot transfer speeds...

Methods and apparatus for measuring substrate edge thickness during...

Determining physical property of substrate

High throughput measurement system

Methods and apparatus for generating a library of spectra

Determining physical property of substrate

Determining physical property of substrate

Patents Applicationslast 30 patents

PARTICLE DETECTION FOR SUBSTRATE PROCESSING

Position And Temperature Monitoring Of ALD Platen Susceptor

PARTICLE DETECTION FOR SUBSTRATE PROCESSING

Non-Contact Sheet Resistance Measurement of Barrier and/or Seed Lay...

COLOR IMAGING FOR CMP MONITORING

SUBSTRATE-SCALE MASK ALIGNMENT

Position And Temperature Monitoring Of ALD Platen Susceptor

Wafer Placement And Gap Control Optimization Through In Situ Feedback

NON-CONTACT SHEET RESISTANCE MEASUREMENT OF BARRIER AND/OR SEED LAY...

ELECTROPLATING TOOL WITH FEEDBACK OF METAL THICKNESS DISTRIBUTION A...

METHODS AND APPARATUS TO DETERMINE PARAMETERS IN METAL-CONTAINING F...

Determining Physical Property of Substrate

METROLOGY SYSTEM FOR IMAGING WORKPIECE SURFACES AT HIGH ROBOT TRANS...

METHOD FOR IMAGING WORKPIECE SURFACES AT HIGH ROBOT TRANSFER SPEEDS...

METHOD FOR IMAGING WORKPIECE SURFACES AT HIGH ROBOT TRANSFER SPEEDS...

METHODS AND APPARATUS FOR GENERATING A LIBRARY OF SPECTRA

Determining Physical Property of Substrate

METROLOGY FOR GST FILM THICKNESS AND PHASE

METHODS AND APPARATUS FOR MEASURING SUBSTRATE EDGE THICKNESS DURING...

Determining Physical Property of Substrate

HIGH THROUGHPUT MEASUREMENT SYSTEM

METHODS AND APPARATUS FOR GENERATING A LIBRARY OF SPECTRA

DETERMINING PHYSICAL PROPERTY OF SUBSTRATE

Continuous in-line monitoring and qualification of polishing rates