Achintya Halder

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Atlanta, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for testing integrated circuits
- Patent number 7,032,151
- Issue date Apr 18, 2006
- Georgia Tech Research Corporation
- Achintya Halder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and methods for testing integrated circuits
- Publication number 20030093730
- Publication date May 15, 2003
- Achintya Halder
- G01 - MEASURING TESTING