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Adalberto M. Ramirez
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Hayward, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
High temperature ceramic socket configured to test packaged semicon...
Patent number
7,602,201
Issue date
Oct 13, 2009
Qualitau, Inc.
Jose Ysaguirre
G01 - MEASURING TESTING
Information
Patent Grant
High temperature ceramic die package and DUT board socket
Patent number
7,598,760
Issue date
Oct 6, 2009
Qualitau, Inc.
Thomas G. Bensing
G01 - MEASURING TESTING
Information
Patent Grant
High temperature open ended zero insertion force (ZIF) test socket
Patent number
7,172,450
Issue date
Feb 6, 2007
QualiTau, Inc.
Robert James Sylvia
G01 - MEASURING TESTING
Information
Patent Grant
Electrostatic discharge (ESD) tool for electronic device under test...
Patent number
7,082,676
Issue date
Aug 1, 2006
QualiTau, Inc.
Adalberto M. Ramirez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High temperature minimal (zero) insertion force socket
Patent number
6,179,640
Issue date
Jan 30, 2001
Qualitau, Inc.
Robert Sikora
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
HIGH TEMPERATURE CERAMIC SOCKET CONFIGURED TO TEST PACKAGED SEMICON...
Publication number
20080315900
Publication date
Dec 25, 2008
QUALITAU, INC.
Jose Ysaguirre
G01 - MEASURING TESTING
Information
Patent Application
Electrostatic discharge (ESD) tool for electronic device under test...
Publication number
20050028356
Publication date
Feb 10, 2005
QualiTau Inc.
Adalberto M. Ramirez
H01 - BASIC ELECTRIC ELEMENTS