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Adam Baer
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Kfar Urivah, IL
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Patents Grants
last 30 patents
Information
Patent Grant
On-tool wavefront aberrations measurement system and method
Patent number
9,395,266
Issue date
Jul 19, 2016
Applied Materials Israel Ltd.
Boris Golberg
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and method for fast changes of focus
Patent number
8,659,754
Issue date
Feb 25, 2014
Applied Materials Israel, Ltd.
Haim Feldman
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and method for fast changes of focus
Patent number
8,488,117
Issue date
Jul 16, 2013
Applied Materials Israel, Ltd.
Haim Feldman
G01 - MEASURING TESTING
Information
Patent Grant
Inspection of EUV masks by a DUV mask inspection tool
Patent number
8,207,504
Issue date
Jun 26, 2012
Applied Materials Israel, Ltd.
Chaim Braude
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System for inspecting a surface employing configurable multi angle...
Patent number
7,315,364
Issue date
Jan 1, 2008
Applied Materials, Israel, Ltd.
Adam Baer
G01 - MEASURING TESTING
Information
Patent Grant
Determination of irradiation parameters for inspection of a surface
Patent number
7,239,389
Issue date
Jul 3, 2007
Applied Materials, Israel, Ltd.
Adam Baer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD
Publication number
20150300913
Publication date
Oct 22, 2015
APPLIED MATERIALS ISRAEL LTD.
Boris Golberg
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
Publication number
20130342893
Publication date
Dec 26, 2013
Haim Feldman
G02 - OPTICS
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
Publication number
20120086937
Publication date
Apr 12, 2012
Haim Feldman
G02 - OPTICS
Information
Patent Application
INSPECTION OF EUV MASKS BY A DUV MASK INSPECTION TOOL
Publication number
20110121193
Publication date
May 26, 2011
APPLIED MATERIALS ISRAEL LIMITED
Chaim Braude
B82 - NANO-TECHNOLOGY
Information
Patent Application
Determination of irradiation parameters for inspection of a surface
Publication number
20060244976
Publication date
Nov 2, 2006
Adam Baer
G01 - MEASURING TESTING
Information
Patent Application
System for inspecting a surface employing configurable multi angle...
Publication number
20060087648
Publication date
Apr 27, 2006
Applied Materials Israel Ltd.
Adam Baer
G01 - MEASURING TESTING