Adam Hartman

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,675,300
- Issue date Mar 9, 2010
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,319,336
- Issue date Jan 15, 2008
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
- Publication number 20080150557
- Publication date Jun 26, 2008
- ZYVEX INSTRUMENTS, LLC
- Christof BAUR
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam device probe operation
- Publication number 20060192116
- Publication date Aug 31, 2006
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Probe tip processing
- Publication number 20050184028
- Publication date Aug 25, 2005
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING