Adam LYONS

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for scanning a sample by a charged particle beam system
- Patent number 11,658,004
- Issue date May 23, 2023
- ASML Netherlands B.V.
- Adam Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for scanning a sample by a charged particle beam system
- Patent number 11,127,563
- Issue date Sep 21, 2021
- ASML Netherlands B.V.
- Adam Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern correction and verification
- Patent number 10,754,256
- Issue date Aug 25, 2020
- ASML Netherlands B.V.
- Thomas I. Wallow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR SCANNING A SAMPLE BY A CHARGED PARTICLE BEAM SYSTEM
- Publication number 20220084784
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Adam LYONS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SCANNING A SAMPLE BY A CHARGED PARTICLE BEAM SYSTEM
- Publication number 20200211820
- Publication date Jul 2, 2020
- ASML NETHERLANDS B.V.
- Adam LYONS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PATTERN CORRECTION AND VERIFICATION
- Publication number 20180275521
- Publication date Sep 27, 2018
- ASML NETHERLANDS B.V.
- Thomas I. WALLOW
- G06 - COMPUTING CALCULATING COUNTING