Adam M. Payne

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Princeton, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Index tunable thin film interference coatings
- Patent number 7,049,004
- Issue date May 23, 2006
- Aegis Semiconductor, Inc.
- Lawrence H. Domash
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable optical instruments
- Patent number 7,002,697
- Issue date Feb 21, 2006
- Aegis Semiconductor, Inc.
- Lawrence H. Domash
- G01 - MEASURING TESTING
Information Patent Grant
Semitransparent optical detector including a polycrystalline layer...
- Patent number 6,879,014
- Issue date Apr 12, 2005
- Aegis Semiconductor, Inc.
- Sigurd Wagner
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semitransparent optical detector on a flexible substrate and method...
- Patent number 6,670,599
- Issue date Dec 30, 2003
- Aegis Semiconductor, Inc.
- Sigurd Wagner
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Index tunable thin film interference coatings
- Publication number 20040062945
- Publication date Apr 1, 2004
- Aegis Semiconductor
- Lawrence Domash
- G02 - OPTICS
Information Patent Application
Index tunable thin film interference coatings
- Publication number 20030087121
- Publication date May 8, 2003
- Lawrence Domash
- G02 - OPTICS
Information Patent Application
Tunable optical instruments
- Publication number 20030072009
- Publication date Apr 17, 2003
- Lawrence H. Domash
- G02 - OPTICS
Information Patent Application
Semitransparent optical detector on a flexible substrate and method...
- Publication number 20020185588
- Publication date Dec 12, 2002
- Sigurd Wagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semitransparent optical detector including a polycrystalline layer...
- Publication number 20020145139
- Publication date Oct 10, 2002
- Sigurd Wagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semitransparent sensor for steering an optical beam
- Publication number 20020092963
- Publication date Jul 18, 2002
- Lawrence H. Domash
- G01 - MEASURING TESTING