Adam URBANCZYK

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Utrecht, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method to change an etch parameter
- Patent number 11,300,887
- Issue date Apr 12, 2022
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus and associated computer product
- Patent number 10,551,750
- Issue date Feb 4, 2020
- ASML Netherlands B.V.
- Adam Jan Urbanczyk
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus and associated computer product
- Patent number 10,310,388
- Issue date Jun 4, 2019
- ASML Netherlands B.V.
- Adam Urbanczyk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A METHOD TO CHANGE AN ETCH PARAMETER
- Publication number 20190285992
- Publication date Sep 19, 2019
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus VAN HAREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus and Associated Computer Product
- Publication number 20190250520
- Publication date Aug 15, 2019
- ASML NETHERLANDS B.V.
- Adam Jan URBANCZYK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus and Associated Computer Product
- Publication number 20180217508
- Publication date Aug 2, 2018
- ASML NETHERLANDS B.V.
- Adam URBANCZYK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY