Adam Wagman

Person

Stow, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for simultaneous consideration of edges and norma...
- Patent number 11,881,000
- Issue date Jan 23, 2024
- Cognex Corporation
- Andrew Hoelscher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for simultaneous consideration of edges and norma...
- Patent number 10,957,072
- Issue date Mar 23, 2021
- Cognex Corporation
- Andrew Hoelscher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for improved scoring of 3D poses and spurious poi...
- Patent number 10,482,621
- Issue date Nov 19, 2019
- Cognex Corporation
- Andrew Hoelscher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for scoring clutter for use in 3D point cloud mat...
- Patent number 10,452,949
- Issue date Oct 22, 2019
- Cognex Corporation
- Hongjun Jia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of configuring a machine vision application program for exec...
- Patent number 9,412,158
- Issue date Aug 9, 2016
- Cognex Corporation
- Jason Adam Davis
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,867,847
- Issue date Oct 21, 2014
- Cognex Technology and Investment Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for training a probe model based machine visio...
- Patent number 8,705,851
- Issue date Apr 22, 2014
- Cognex Corporation
- Simon Barker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for training a probe model based machine visio...
- Patent number 8,457,390
- Issue date Jun 4, 2013
- Cognex Corporation
- Simon Barker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,363,942
- Issue date Jan 29, 2013
- Cognex Technology and Investment Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,363,972
- Issue date Jan 29, 2013
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,363,956
- Issue date Jan 29, 2013
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,335,380
- Issue date Dec 18, 2012
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,320,675
- Issue date Nov 27, 2012
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,295,613
- Issue date Oct 23, 2012
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,270,748
- Issue date Sep 18, 2012
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,254,695
- Issue date Aug 28, 2012
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 8,229,222
- Issue date Jul 24, 2012
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,251,366
- Issue date Jul 31, 2007
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for locating bar codes and symbols in an image
- Patent number 7,181,066
- Issue date Feb 20, 2007
- Cognex Technology and Investment Corporation
- Adam Wagman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,164,796
- Issue date Jan 16, 2007
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatuses for detecting classifying and measuring spo...
- Patent number 7,162,073
- Issue date Jan 9, 2007
- Cognex Technology and Investment Corporation
- Yusuf Akgul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,088,862
- Issue date Aug 8, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,065,262
- Issue date Jun 20, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,058,225
- Issue date Jun 6, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,043,081
- Issue date May 9, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fast, robust, multi-dimensional pattern recognition
- Patent number 7,016,539
- Issue date Mar 21, 2006
- Cognex Corporation
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 7,006,712
- Issue date Feb 28, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 6,993,192
- Issue date Jan 31, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 6,985,625
- Issue date Jan 10, 2006
- Cognex Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast high-accuracy multi-dimensional pattern inspection
- Patent number 6,975,764
- Issue date Dec 13, 2005
- Cognex Technology and Investment Corporation
- William Silver
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS CONSIDERATION OF EDGES AND NORMA...
- Publication number 20210366153
- Publication date Nov 25, 2021
- COGNEX CORPORATION
- Andrew Hoelscher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS CONSIDERATION OF EDGES AND NORMA...
- Publication number 20190259177
- Publication date Aug 22, 2019
- COGNEX CORPORATION
- Andrew Hoelscher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED SCORING OF 3D POSES AND SPURIOUS POI...
- Publication number 20180130224
- Publication date May 10, 2018
- COGNEX CORPORATION
- Andrew Hoelscher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SCORING CLUTTER FOR USE IN 3D POINT CLOUD MAT...
- Publication number 20170140537
- Publication date May 18, 2017
- COGNEX CORPORATION
- Hongjun Jia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Training a Probe Model Based Machine Visio...
- Publication number 20130182948
- Publication date Jul 18, 2013
- Simon A. Barker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Fast, Robust, Multi-Dimensional Pattern Recognition
- Publication number 20130142421
- Publication date Jun 6, 2013
- COGNEX CORPORATION
- William M. Silver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CONFIGURING A MACHINE VISION APPLICATION PROGRAM FOR EXEC...
- Publication number 20100049341
- Publication date Feb 25, 2010
- Jason Adam Davis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for in-line inspection of stencil aperture blockage
- Publication number 20020081025
- Publication date Jun 27, 2002
- Adam H. Wagman
- G06 - COMPUTING CALCULATING COUNTING

Adam Wagman

Person

Patents Grantslast 30 patents

System and method for simultaneous consideration of edges and norma...

System and method for simultaneous consideration of edges and norma...

System and method for improved scoring of 3D poses and spurious poi...

System and method for scoring clutter for use in 3D point cloud mat...

Method of configuring a machine vision application program for exec...

Method for fast, robust, multi-dimensional pattern recognition

Method and apparatus for training a probe model based machine visio...

Method and apparatus for training a probe model based machine visio...

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Method for fast, robust, multi-dimensional pattern recognition

Fast high-accuracy multi-dimensional pattern inspection

Method for locating bar codes and symbols in an image

Fast high-accuracy multi-dimensional pattern inspection

Methods and apparatuses for detecting classifying and measuring spo...

Fast high-accuracy multi-dimensional pattern inspection

Fast high-accuracy multi-dimensional pattern inspection

Fast high-accuracy multi-dimensional pattern inspection

Fast high-accuracy multi-dimensional pattern inspection

Method for fast, robust, multi-dimensional pattern recognition

Fast high-accuracy multi-dimensional pattern inspection

Fast high-accuracy multi-dimensional pattern inspection

Fast high-accuracy multi-dimensional pattern inspection

Fast high-accuracy multi-dimensional pattern inspection

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR SIMULTANEOUS CONSIDERATION OF EDGES AND NORMA...

SYSTEM AND METHOD FOR SIMULTANEOUS CONSIDERATION OF EDGES AND NORMA...

SYSTEM AND METHOD FOR IMPROVED SCORING OF 3D POSES AND SPURIOUS POI...

SYSTEM AND METHOD FOR SCORING CLUTTER FOR USE IN 3D POINT CLOUD MAT...

Method and Apparatus for Training a Probe Model Based Machine Visio...

Method for Fast, Robust, Multi-Dimensional Pattern Recognition

METHOD OF CONFIGURING A MACHINE VISION APPLICATION PROGRAM FOR EXEC...

System and method for in-line inspection of stencil aperture blockage